Search Results for Materials -- Microscopy.

1.

Microscopy of Semiconducting Materials 2007

Author

Cullis, A. G. editor. Midgley, P. A. editor. SpringerLink (Online service)

Preferred Shelf Number

ONLINE

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http://dx.doi.org/10.1007/978-1-4020-8615-1

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2.

$Cover image for Transmission Electron Microscopy and Diffractometry of Materials$

Transmission Electron Microscopy and Diffractometry of Materials

Author

Fultz, Brent. author. Howe, James. author. SpringerLink (Online service)

Preferred Shelf Number

ONLINE(333265.1)

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http://dx.doi.org/10.1007/978-3-642-29761-8

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3.

$Cover image for Transmission Electron Microscopy and Diffractometry of Materials$

Transmission Electron Microscopy and Diffractometry of Materials

Author

Fultz, Brent. author. Howe, James M. author. SpringerLink (Online service)

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ONLINE

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http://dx.doi.org/10.1007/978-3-540-73886-2

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4.

Electron microscopy and structure of materials : proceedings

Author

International Materials Symposium (5th : 1971 : University of California, Berkeley) Thomas, Gareth. , ed. Fulrath, Richard M. , ed. Fisher, Robert M., ed. University Conference on Ceramic Science (7th : 1971 : Berkeley)

Preferred Shelf Number

TA 407 I65 1972

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5.

Scanning Probe Microscopy of Functional Materials Nanoscale Imaging and Spectroscopy

Author

Kalinin, Sergei V. editor. Gruverman, Alexei. editor. SpringerLink (Online service)

Preferred Shelf Number

ONLINE

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http://dx.doi.org/10.1007/978-1-4419-7167-8

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6.

Transmission Electron Microscopy A Textbook for Materials Science

Author

Williams, David B. author. Carter, C. Barry. author. SpringerLink (Online service)

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ONLINE

Electronic Access

http://dx.doi.org/10.1007/978-0-387-76501-3

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7.

EMC 2008 14th European Microscopy Congress 1–5 September 2008, Aachen, Germany Volume 2: Materials Science

Author

Richter, Silvia. editor. Schwedt, Alexander. editor. SpringerLink (Online service)

Preferred Shelf Number

ONLINE

Electronic Access

http://dx.doi.org/10.1007/978-3-540-85226-1

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8.

Cover image for Scanning Probe Microscopy: Characterization, Nanofabrication and Device Application of Functional Materials Proceedings of the NATO Advanced Study Institute on Scanning Probe Microscopy: Characterization, Nanofabrication and Device Application of Functional Materials Algarve, Portugal 1–13 October 2002

Scanning Probe Microscopy: Characterization, Nanofabrication and Device Application of Functional Materials Proceedings of the NATO Advanced Study Institute on Scanning Probe Microscopy: Characterization, Nanofabrication and Device Application of Functional Materials Algarve, Portugal 1–13 October 2002

Author

Vilarinho, Paula Maria. editor. Rosenwaks, Yossi. editor. Kingon, Angus. editor. SpringerLink (Online service)

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ONLINE

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http://dx.doi.org/10.1007/1-4020-3019-3

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9.

Microscopy of Semiconducting Materials Proceedings of the 14th Conference, April 11–14, 2005, Oxford, UK

Author

Cullis, A. G. editor. Hutchison, J. L. editor. SpringerLink (Online service)

Preferred Shelf Number

ONLINE

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http://dx.doi.org/10.1007/3-540-31915-8

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10.

Characterization of High Tc Materials and Devices by Electron Microscopy

Author

Browning, Nigel D.. Pennycook, Stephen J..

Preferred Shelf Number

ONLINE

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Access by subscription

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11.

Handbook of microscopy applications in materials science, solid-state physics, and chemistry

Author

Amelinckx, S. (Severin) Wiley InterScience (Online service)

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ONLINE

Electronic Access

John Wiley http://dx.doi.org/10.1002/9783527619283

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12.

Handbook of microscopy applications in materials science, solid-state physics, and chemistry

Author

Amelinckx, S. (Severin) Wiley InterScience (Online service)

Preferred Shelf Number

ONLINE

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Wiley InterScience An electronic book accessible through the World Wide Web; click for information

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13.

Handbook of microscopy applications in materials science, solid-state physics and chemistry. Methods I

Author

Amelinckx, S. (Severin) Wiley InterScience (Online service)

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ONLINE

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14.

Handbook of microscopy applications in materials science, solid-state physics and chemistry. Applications

Author

Amelinckx, S. (Severin) Wiley InterScience (Online service)

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ONLINE

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Wiley InterScience An electronic book accessible through the World Wide Web; click for information

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15.

$Cover image for Electron microscopy in plasticity and fracture research of materials : proceedings of the international symposium held at Holzhau near Dresden, 8 to 13 October 1989$

Electron microscopy in plasticity and fracture research of materials : proceedings of the international symposium held at Holzhau near Dresden, 8 to 13 October 1989

Author

Messerschmidt, U. , ed.

Preferred Shelf Number

TA 417.35 E43 1990

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16.

Scanning electron microscopy : applications to materials and device science

Author

Thornton, P. R.

Preferred Shelf Number

QH 212.E4 T52 1968 1.K

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17.

Electron microscopy in heterogeneous catalysis

Author

Gai, Pratibha L., 1948- Boyes, E. D. (Edward D.)

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ONLINE

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18.

Characterization of radiation-damage by transmission electron microscopy

Author

Jenkins, M. L., 1949- Kirk, M. A., 1942-

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ONLINE

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19.

Cover image for Atlas of Functional Anatomy for Regional Anesthesia and Pain Medicine Human Structure, Ultrastructure and 3D Reconstruction Images

Atlas of Functional Anatomy for Regional Anesthesia and Pain Medicine Human Structure, Ultrastructure and 3D Reconstruction Images

Author

Reina, Miguel Angel. editor. De Andrés, José Antonio. editor. Hadzic, Admir. editor. Prats-Galino, Alberto. editor. Sala-Blanch, Xavier. editor.

Preferred Shelf Number

XX(520074.1)

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https://doi.org/10.1007/978-3-319-09522-6

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20.

Fundamentals and applications of ultrasonic waves

Author

Cheeke, J. David N.

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ONLINE

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21.

Aberration-corrected analytical transmission electron microscopy

Author

Brydson, Rik, editor, author.

Preferred Shelf Number

ONLINE(318971.1)

Electronic Access

Connect to MyiLibrary resource.
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John Wiley http://dx.doi.org/10.1002/9781119978848

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22.

Nanoscience Nanobiotechnology and Nanobiology

Author

Boisseau, Patrick. editor. Houdy, Philippe. editor. Lahmani, Marcel. editor. SpringerLink (Online service)

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ONLINE

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http://dx.doi.org/10.1007/978-3-540-88633-4

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23.

Handbook of surface and interface analysis methods for problem-solving

Author

Rivir̈e, J. C. Myhra, S. (Sverre), 1943-

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ONLINE

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24.

Microstructural characterization of materials

Author

Brandon, D. G. Kaplan, Wayne D. Wiley InterScience (Online service)

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ONLINE

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Online text
http://onlinelibrary.wiley.com/book/10.1002/9780470727133
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John Wiley http://dx.doi.org/10.1002/9780470727133
MyiLibrary, Table of contents http://www.myilibrary.com?id=234294&ref=toc

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25.

Carbon nanotubes properties and applications

Author

O'Connell, Michael (Michael J.)

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26.

Transmission electron energy loss spectrometry in materials science and the EELS atlas

Author

Ahn, C. C. (Channing C.) John Wiley & Sons.

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ONLINE

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John Wiley http://dx.doi.org/10.1002/3527605495

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27.

Mechanical tribology materials, characterization, and applications

Author

Totten, George E. Liang, Hong.

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28.

Nano and microstructural design of advanced materials a commemorative volume on Professor G. Thomas' seventieth birthday

Author

Thomas, Gareth, 1932- Meyers, Marc A. Ritchie, R. O. (Robert O.) Sarikaya, Mehmet.

Preferred Shelf Number

ONLINE

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ScienceDirect http://www.sciencedirect.com/science/book/9780080443737

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29.

Industrial applications of electron microscopy

Author

Li, Zhigang R., 1958-

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