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1. 
Cover image for Electrical overstress (EOS) : devices, circuits, and systems
Electrical overstress (EOS) : devices, circuits, and systems
Author 
Voldman, Steven H.
Preferred Shelf Number 
TK7871.852 V648 2014
Format: 
Availability 
Beytepe Library~1
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2. 
Cover image for Interatomic bonding in solids fundamentals, simulation, applications
Interatomic bonding in solids fundamentals, simulation, applications
Author 
Levitin, Valim.
Preferred Shelf Number 
ONLINE(342212.1)
Electronic Access 
John Wiley http://dx.doi.org/10.1002/9783527671557
Format: 
Availability 
Online Library~1
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3. 
Cover image for Systematische Beurteilung technischer Schadensflle
Systematische Beurteilung technischer Schadensflle
Author 
Pohl, Michael. Lange, Günter.
Preferred Shelf Number 
ONLINE(342231.1)
Electronic Access 
ebrary http://alltitles.ebrary.com/Doc?id=10839246
John Wiley http://dx.doi.org/10.1002/9783527683161
Format: 
Availability 
Online Library~1
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4. 
Cover image for ESD failure mechanisms and models
ESD failure mechanisms and models
Author 
Voldman, Steven H. Wiley InterScience (Online service)
Preferred Shelf Number 
ONLINE
Electronic Access 
John Wiley http://dx.doi.org/10.1002/9780470747254
http://site.ebrary.com/lib/alltitles/Doc?id=10317806
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Online Library~1
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