Search Results for Digital integrated circuits -- Testing.

5 Results Found

00000DEFAULT

Digital integrated circuits : design-for-test using Simulink and Stateflow

Author

Perelroyzen, Evgeni.

Preferred Shelf Number

TK7874 .P445 2007

Format:

Availability

Beytepe Library~1

Available:
Copies:

The VLSI handbook

Author

Chen, Wai-Kai, 1936-

Preferred Shelf Number

ONLINE

Electronic Access

Distributed by publisher. Purchase or institutional license may be required for access.

Format:

Availability

Online Library~1

Available:
Copies:

Essentials of electronic testing for digital, memory, and mixed-signal VLSI circuits

Author

Bushnell, Michael L. (Michael Lee), 1950- Agrawal, Vishwani D., 1943-

Preferred Shelf Number

TK7874.75 B87 2000

Format:

Availability

Beytepe Library~1

Available:
Copies:

Digital circuit testing a guide to DFT and other techniques

Author

Wang, Francis C.

Preferred Shelf Number

ONLINE

Electronic Access

ScienceDirect http://www.sciencedirect.com/science/book/9780127345802

Format:

Availability

Online Library~1

Available:
Copies:

Digital systems testing and testable design

Author

Abramovici, Miron. Breuer, Melvin A. Friedman, Arthur D.

Preferred Shelf Number

ONLINE

Electronic Access

IEEE Xplore http://ieeexplore.ieee.org/xpl/bkabstractplus.jsp?bkn=5266057

Format:

Availability

Online Library~1

Available:
Copies:

	{displayName}	{count}
{error}