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1. 
Cover image for Dynamic Formal Epistemology
Dynamic Formal Epistemology
Author 
Girard, Patrick. editor. Roy, Olivier. editor. Marion, Mathieu. editor. SpringerLink (Online service)
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ONLINE
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http://dx.doi.org/10.1007/978-94-007-0074-1
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2. 
Cover image for Power-Aware Testing and Test Strategies for Low Power Devices
Power-Aware Testing and Test Strategies for Low Power Devices
Author 
Girard, Patrick. editor. Nicolici, Nicola. editor. Wen, Xiaoqing. editor. SpringerLink (Online service)
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ONLINE
Electronic Access 
http://dx.doi.org/10.1007/978-1-4419-0928-2
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3. 
Cover image for Quaternions, Clifford Algebras and Relativistic Physics
Quaternions, Clifford Algebras and Relativistic Physics
Author 
Girard, Patrick R. author. SpringerLink (Online service)
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ONLINE
Electronic Access 
http://dx.doi.org/10.1007/978-3-7643-7791-5
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4. 
Cover image for Advanced Test Methods for SRAMs Effective Solutions for Dynamic Fault Detection in Nanoscaled Technologies
Advanced Test Methods for SRAMs Effective Solutions for Dynamic Fault Detection in Nanoscaled Technologies
Author 
Bosio, Alberto. author. Dilillo, Luigi. author. Girard, Patrick. author. Pravossoudovitch, Serge. author. Virazel, Arnaud. author.
Preferred Shelf Number 
ONLINE
Electronic Access 
http://dx.doi.org/10.1007/978-1-4419-0938-1
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