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1. 
Cover image for Terrestrial radiation effects in ULSI devices and electronic systems
Terrestrial radiation effects in ULSI devices and electronic systems
Author 
Ibe, Eishi H., author.
Preferred Shelf Number 
ONLINE(342252.1)
Electronic Access 
John Wiley http://dx.doi.org/10.1002/9781118479308
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2. 
Cover image for Green electronics manufacturing creating environmental sensible products
Green electronics manufacturing creating environmental sensible products
Author 
Wang, John X., 1962-
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ONLINE
Electronic Access 
Distributed by publisher. Purchase or institutional license may be required for access.
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3. 
Cover image for Semiconductor process reliability in practice
Semiconductor process reliability in practice
Author 
Gan, Zhenghao. Wong, Waisum. Liou, Juin J.
Preferred Shelf Number 
ONLINE
Electronic Access 
Subscription required
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4. 
Cover image for ESD failure mechanisms and models
ESD failure mechanisms and models
Author 
Voldman, Steven H. Wiley InterScience (Online service)
Preferred Shelf Number 
ONLINE
Electronic Access 
John Wiley http://dx.doi.org/10.1002/9780470747254
http://site.ebrary.com/lib/alltitles/Doc?id=10317806
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5. 
Cover image for Low-power HF Microelectronics A unified approach
Low-power HF Microelectronics A unified approach
Author 
Machado, Gerson A. S., ed.
Preferred Shelf Number 
ONLINE
Electronic Access 
http://dx.doi.org/10.1049/PBCS008E
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6. 
Cover image for Electronics reliability and measurement technology nondestructive evaluation
Electronics reliability and measurement technology nondestructive evaluation
Author 
Heyman, Joseph S.
Preferred Shelf Number 
ONLINE
Electronic Access 
ScienceDirect http://www.sciencedirect.com/science/book/9780815511717
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