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Digital integrated circuits -- Testing.
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1. 
Cover image for Testing for small-delay defects in nanoscale CMOS integrated circuits
Testing for small-delay defects in nanoscale CMOS integrated circuits
Author 
Goel, Sandeep K, editor of compilation. Chakrabarty, Krishnendu, editor of compilation.
Preferred Shelf Number 
TK7871.99 .M44 T43 2014
Electronic Access 
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2. 
Cover image for Electronics, power electronics, optoelectronics, microwaves, electromagnetics, and radar
Electronics, power electronics, optoelectronics, microwaves, electromagnetics, and radar
Author 
Dorf, Richard C., author Dorf, Richard C., editor.
Preferred Shelf Number 
TK145
Electronic Access 
Taylor & Francis https://www.taylorfrancis.com/books/9781315222158
OCLC metadata license agreement http://www.oclc.org/content/dam/oclc/forms/terms/vbrl-201703.pdf
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3. 
Cover image for Design of 3D integrated circuits and systems
Design of 3D integrated circuits and systems
Author 
Sharma, Rohit, editor.
Preferred Shelf Number 
TK7874.893 .D48 2014
Electronic Access 
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4. 
Cover image for 3D IC stacking technology
3D IC stacking technology
Author 
Wu, Banqiu. Kumar, Ajay. Ramaswami, Sesh.
Preferred Shelf Number 
ONLINE
Electronic Access 
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5. 
Cover image for ESD failure mechanisms and models
ESD failure mechanisms and models
Author 
Voldman, Steven H. Wiley InterScience (Online service)
Preferred Shelf Number 
ONLINE
Electronic Access 
John Wiley http://dx.doi.org/10.1002/9780470747254
http://site.ebrary.com/lib/alltitles/Doc?id=10317806
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6. 
Cover image for RF measurements for cellular phones and wireless data systems
RF measurements for cellular phones and wireless data systems
Author 
Scott, Allan W. Frobenius, Rex.
Preferred Shelf Number 
ONLINE
Electronic Access 
IEEE Xplore http://ieeexplore.ieee.org/xpl/bkabstractplus.jsp?bkn=5361014
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7. 
Cover image for Test and Diagnosis of Analogue, Mixed-Signal and RF Integrated Circuits The system on chip approach
Test and Diagnosis of Analogue, Mixed-Signal and RF Integrated Circuits The system on chip approach
Author 
Yichuang Sun, ed.
Preferred Shelf Number 
ONLINE
Electronic Access 
http://dx.doi.org/10.1049/PBCS019E
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8. 
Cover image for System-on-chip test architectures nanometer design for testability
System-on-chip test architectures nanometer design for testability
Author 
Wang, Laung-Terng. Stroud, Charles E. Touba, Nur A.
Preferred Shelf Number 
ONLINE
Electronic Access 
ScienceDirect http://www.sciencedirect.com/science/book/9780123739735
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9. 
Cover image for Digital design and fabrication
Digital design and fabrication
Author 
Oklobdzija, Vojin G.
Preferred Shelf Number 
TK7885 .D54 2008
Electronic Access 
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10. 
Cover image for Digital integrated circuits : design-for-test using Simulink and Stateflow
Digital integrated circuits : design-for-test using Simulink and Stateflow
Author 
Perelroyzen, Evgeni.
Preferred Shelf Number 
TK7874 .P445 2007
Format: 
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11. 
Cover image for The VLSI handbook
The VLSI handbook
Author 
Chen, Wai-Kai, 1936-
Preferred Shelf Number 
TK7874.75 .V573 2007
Electronic Access 
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12. 
Cover image for VLSI test principles and architectures design for testability
VLSI test principles and architectures design for testability
Author 
Wang, Laung-Terng. Wu, Cheng-Wen, EE Ph. D. Wen, Xiaoqing.
Preferred Shelf Number 
ONLINE
Electronic Access 
ScienceDirect http://www.sciencedirect.com/science/book/9780123705976
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