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Cover image for Defect control in semiconductors proceedings of the International Conference on the Science and Technology of Defect Control in Semiconductors, the Yokohama 21st century forum, Yokohama, Japan, September 17-22 1989. Vol. 2
Title:
Defect control in semiconductors proceedings of the International Conference on the Science and Technology of Defect Control in Semiconductors, the Yokohama 21st century forum, Yokohama, Japan, September 17-22 1989. Vol. 2
Author:
International Conference on the Science and Technology of Defect Control in Semiconductors (1989 : Yokohama-shi, Japan)
ISBN:
9780444884299
Conference Author:
International Conference on the Science and Technology of Defect Control in Semiconductors (1989 : Yokohama-shi, Japan)
Publication Information:
Amsterdam ; New York : North-Holland ; New York, N.Y., U.S.A. : Distributors for the U.S. and Canada, Elsevier Science Pub. Co., 1990.
Physical Description:
1 online resource : ill.
Subject Term:
Semiconductors -- Defects -- Congresses.

Materials -- Defects -- Congresses.
Added Author:
Sumino, K. (Kōji), 1931-
Electronic Access:
ScienceDirect http://www.sciencedirect.com/science/book/9780444884299
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