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1. 
Cover image for Handbook of surface and nanometrology
Handbook of surface and nanometrology
Author 
Whitehouse, D. J. (David J.), author. Whitehouse, D. J. (David J.). Handbook of surface metrology.
Preferred Shelf Number 
TA418.7 .W47 2011
Electronic Access 
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2. 
Cover image for Fundamental principles of engineering nanometrology
Fundamental principles of engineering nanometrology
Author 
Leach, R. K.
Preferred Shelf Number 
ONLINE
Electronic Access 
ScienceDirect http://www.sciencedirect.com/science/book/9780080964546
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3. 
Cover image for Fundamental principles of engineering nanometrology
Fundamental principles of engineering nanometrology
Author 
Leach, R. K.
Preferred Shelf Number 
ONLINE(355774.1)
Electronic Access 
ScienceDirect http://www.sciencedirect.com/science/book/9781455777532
http://www.sciencedirect.com/science/book/9780080964546
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4. 
Cover image for Handbook of surface and nanometrology
Handbook of surface and nanometrology
Author 
Whitehouse, D. J. (David J.), author. Whitehouse, D. J. (David J.). Handbook of surface metrology.
Preferred Shelf Number 
TA418.7 .W45 2003
Electronic Access 
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5. 
Cover image for Quantitative Data Processing in Scanning Probe Microscopy : SPM Applications for Nanometrology.
Quantitative Data Processing in Scanning Probe Microscopy : SPM Applications for Nanometrology.
Author 
Klapetek, Petr.
Preferred Shelf Number 
ONLINE
Electronic Access 
ScienceDirect https://www.sciencedirect.com/science/book/9780128133477
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6. 
Cover image for Precision Nanometrology Sensors and Measuring Systems for Nanomanufacturing
Precision Nanometrology Sensors and Measuring Systems for Nanomanufacturing
Author 
Gao, Wei. author. SpringerLink (Online service)
Preferred Shelf Number 
ONLINE
Electronic Access 
http://dx.doi.org/10.1007/978-1-84996-254-4
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7. 
Cover image for Metrology and Measurement Uncertainty Concepts and Applications
Metrology and Measurement Uncertainty Concepts and Applications
Author 
Novellino do Rosario, Pedro Paulo. author. Mendes, Alexandre. author. SpringerLink (Online service)
Preferred Shelf Number 
ONLINE
Electronic Access 
https://doi.org/10.1007/978-3-031-82303-9
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8. 
Cover image for Advances in Metrology Select Proceedings of AdMet 2024
Advances in Metrology Select Proceedings of AdMet 2024
Author 
Yadav, Sanjay. editor. Garg, Naveen. editor. Kumar, Mukesh. editor. Aggarwal, Shankar G. editor. Jaiswal, Shiv Kumar. editor.
Preferred Shelf Number 
ONLINE
Electronic Access 
https://doi.org/10.1007/978-981-96-6418-4
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9. 
Cover image for Handbook of Metrology and Applications
Handbook of Metrology and Applications
Author 
Aswal, Dinesh K. editor. Yadav, Sanjay. editor. Takatsuji, Toshiyuki. editor. Rachakonda, Prem. editor. Kumar, Harish. editor.
Preferred Shelf Number 
ONLINE
Electronic Access 
https://doi.org/10.1007/978-981-99-2074-7
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10. 
Cover image for Recent Global Research and Education: Technological Challenges Proceedings of the 15th International Conference on Global Research and Education Inter-Academia 2016
Recent Global Research and Education: Technological Challenges Proceedings of the 15th International Conference on Global Research and Education Inter-Academia 2016
Author 
Jabłoński, Ryszard. editor. Szewczyk, Roman. editor. SpringerLink (Online service)
Preferred Shelf Number 
ONLINE
Electronic Access 
https://doi.org/10.1007/978-3-319-46490-9
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11. 
Cover image for Advanced Mechatronics Solutions
Advanced Mechatronics Solutions
Author 
Jabłoński, Ryszard. editor. Brezina, Tomas. editor. SpringerLink (Online service)
Preferred Shelf Number 
ONLINE
Electronic Access 
https://doi.org/10.1007/978-3-319-23923-1
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12. 
Cover image for Handbook of nanophysics. Principles and methods
Handbook of nanophysics. Principles and methods
Author 
Sattler, Klaus D.
Preferred Shelf Number 
QC173.4 .M5 H358 2009
Electronic Access 
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