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1. 
Cover image for Optical inspection of microsystems
Optical inspection of microsystems
Author 
Osten, Wolfgang.
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ONLINE
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Distributed by publisher. Purchase or institutional license may be required for access.
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Cover image for Smart inspection systems techniques and applications of intelligent vision
Smart inspection systems techniques and applications of intelligent vision
Author 
Pham, D. T. Alcock, R. J.
Preferred Shelf Number 
ONLINE
Electronic Access 
ScienceDirect http://www.sciencedirect.com/science/book/9780125541572
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