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1. 
Cover image for Lattice defects in semiconductors
Lattice defects in semiconductors
Author 
International Symposium on Lattice Defects in Semiconductors (1966 : Tokyo). Hasiguti, Ryukiti R., ed.
Preferred Shelf Number 
QC 612.S4 I59 1966
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2. 
Cover image for Gettering Defects in Semiconductors
Gettering Defects in Semiconductors
Author 
Perevoschikov, Victor A. author. Skoupov, Vladimir D. author. SpringerLink (Online service)
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ONLINE
Electronic Access 
http://dx.doi.org/10.1007/3-540-29499-6
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3. 
Cover image for Light-induced defects in semiconductors
Light-induced defects in semiconductors
Author 
Morigaki, Kazuo, author. Hikita, Harumi, author. Ogihara, Chisato, 1951- author.
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ONLINE(342751.1)
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4. 
Cover image for Theory of Defects in Semiconductors
Theory of Defects in Semiconductors
Author 
Drabold, David A. editor. Estreicher, Stefan K. editor. SpringerLink (Online service)
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ONLINE
Electronic Access 
http://dx.doi.org/10.1007/11690320
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5. 
Cover image for Defects-recognition imaging and physics in semiconductors XIV selected peer reviewed papers from the 14th international conference on defects-recognition, imaging and physics in semiconductors, September 25-29, 2011, Miyazaki, Japan
Defects-recognition imaging and physics in semiconductors XIV selected peer reviewed papers from the 14th international conference on defects-recognition, imaging and physics in semiconductors, September 25-29, 2011, Miyazaki, Japan
Author 
International Conference on Defects: Recognition, Imaging and Physics in Semiconductors (2011 : Miyazaki, Japan) Yamada-Kaneta, Hiroshi. Sakai, Akira.
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ONLINE
Electronic Access 
EBSCOhost http://search.ebscohost.com/login.aspx?direct=true&scope=site&db=nlebk&db=nlabk&AN=517215
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6. 
Cover image for CdTe and related compounds physics, defects, technology, hetero- and nanostructures and applications : physics, CdTe-based nanostructures, and semimagnetic semiconductors, defects
CdTe and related compounds physics, defects, technology, hetero- and nanostructures and applications : physics, CdTe-based nanostructures, and semimagnetic semiconductors, defects
Author 
Triboulet, R. Siffert, P. (Paul)
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ONLINE
Electronic Access 
ScienceDirect http://www.sciencedirect.com/science/book/9780080464091
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7. 
Cover image for Extended Defects in Semiconductors Electronic Properties, Device Effects and Structures
Extended Defects in Semiconductors Electronic Properties, Device Effects and Structures
Author 
Holt, D. B.. Yacobi, B. G..
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ONLINE
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8. 
Cover image for III-nitride semiconductors electrical, structural, and defects properties
III-nitride semiconductors electrical, structural, and defects properties
Author 
Manasreh, Mahmoud Omar.
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ONLINE
Electronic Access 
ScienceDirect http://www.sciencedirect.com/science/book/9780444506306
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9. 
Cover image for Handbook of luminescent semiconductor materials
Handbook of luminescent semiconductor materials
Author 
Bergman, Leah. McHale, Jeanne L.
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10. 
Cover image for Trap level spectroscopy in amorphous semiconductors
Trap level spectroscopy in amorphous semiconductors
Author 
Mikla, Victor I.
Preferred Shelf Number 
ONLINE
Electronic Access 
ScienceDirect http://www.sciencedirect.com/science/book/9780123847157
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11. 
Cover image for Defects and diffusion, theory and simulation an annual retrospective II
Defects and diffusion, theory and simulation an annual retrospective II
Author 
Fisher, D. J., editor of compilation.
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ONLINE
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EBSCOhost http://search.ebscohost.com/login.aspx?direct=true&scope=site&db=nlebk&db=nlabk&AN=503469
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12. 
Cover image for Transient-induced latchup in CMOS integrated circuits
Transient-induced latchup in CMOS integrated circuits
Author 
Ker, Ming-Dou. Hsu, Sheng-Fu.
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ONLINE
Electronic Access 
IEEE Xplore http://ieeexplore.ieee.org/xpl/bkabstractplus.jsp?bkn=5453758
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