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1. 
Cover image for Nanometer CMOS ICs From Basics to ASICs
Nanometer CMOS ICs From Basics to ASICs
Author 
Veendrick, Harry. author. SpringerLink (Online service)
Preferred Shelf Number 
ONLINE
Electronic Access 
https://doi.org/10.1007/978-3-031-64249-4
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2. 
Cover image for Practical ESD protection design
Practical ESD protection design
Author 
Wang, Albert Z. H., 1962- author.
Preferred Shelf Number 
TK7874
Electronic Access 
https://onlinelibrary.wiley.com/doi/book/10.1002/9781119850434
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3. 
Cover image for Electronics, power electronics, optoelectronics, microwaves, electromagnetics, and radar
Electronics, power electronics, optoelectronics, microwaves, electromagnetics, and radar
Author 
Dorf, Richard C., author Dorf, Richard C., editor.
Preferred Shelf Number 
TK145
Electronic Access 
Taylor & Francis https://www.taylorfrancis.com/books/9781315222158
OCLC metadata license agreement http://www.oclc.org/content/dam/oclc/forms/terms/vbrl-201703.pdf
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4. 
Cover image for Nanometer CMOS ICs From Basics to ASICs
Nanometer CMOS ICs From Basics to ASICs
Author 
J.M. Veendrick, Harry. author. SpringerLink (Online service)
Preferred Shelf Number 
ONLINE
Electronic Access 
https://doi.org/10.1007/978-3-319-47597-4
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5. 
Cover image for Computational Advancement in Communication Circuits and Systems Proceedings of ICCACCS 2014
Computational Advancement in Communication Circuits and Systems Proceedings of ICCACCS 2014
Author 
Maharatna, Koushik. editor. Dalapati, Goutam Kumar. editor. Banerjee, P K. editor. Mallick, Amiya Kumar. editor. Mukherjee, Moumita. editor.
Preferred Shelf Number 
ONLINE
Electronic Access 
https://doi.org/10.1007/978-81-322-2274-3
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6. 
Cover image for Testing for small-delay defects in nanoscale CMOS integrated circuits
Testing for small-delay defects in nanoscale CMOS integrated circuits
Author 
Goel, Sandeep K, editor of compilation. Chakrabarty, Krishnendu, editor of compilation.
Preferred Shelf Number 
TK7871.99 .M44 T43 2014
Electronic Access 
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7. 
Cover image for Advanced calculations for defects in materials : electronic structure methods
Advanced calculations for defects in materials : electronic structure methods
Author 
Alkauskas, Audrius.
Preferred Shelf Number 
TA410 A379 2011
Format: 
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Beytepe Library~1
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8. 
Cover image for RF and microwave modeling and measurement techniques for field effect transistors
RF and microwave modeling and measurement techniques for field effect transistors
Author 
Gao, Jianjun, 1968- Knovel (Firm)
Preferred Shelf Number 
ONLINE
Electronic Access 
EBSCOhost http://search.ebscohost.com/login.aspx?direct=true&scope=site&db=nlebk&db=nlabk&AN=571541
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9. 
Cover image for Microelectronics
Microelectronics
Author 
Whitaker, Jerry C.
Preferred Shelf Number 
TK7874 .M4587 2006
Electronic Access 
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10. 
Cover image for Semiconductor material and device characterization
Semiconductor material and device characterization
Author 
Schroder, Dieter K.
Preferred Shelf Number 
ONLINE
Electronic Access 
IEEE Xplore http://ieeexplore.ieee.org/xpl/bkabstractplus.jsp?bkn=5237928
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11. 
Cover image for Surface analysis with STM and AFM experimental and theoretical aspects of image analysis
Surface analysis with STM and AFM experimental and theoretical aspects of image analysis
Author 
Magonov, Sergei N. Whangbo, Myung-Hwan. Wiley InterScience (Online service)
Preferred Shelf Number 
ONLINE
Electronic Access 
John Wiley http://dx.doi.org/10.1002/9783527615117
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12. 
Cover image for Principles of semiconductor network testing
Principles of semiconductor network testing
Author 
Afshar, Amir.
Preferred Shelf Number 
ONLINE
Electronic Access 
ScienceDirect http://www.sciencedirect.com/science/book/9780750694728
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