Author
Oomens, C. W. J., author. Brekelmans, Marcel, author. Loerakker, Sandra, 1982- author. Baaijens, Franciscus Petrus Thomas, author.
Preferred Shelf Number
QH513 .O56 2018
Electronic Access
Format:
Availability
Online Library~1
Copies:
Author
Kutz, Myer, editor.
Preferred Shelf Number
ONLINE
Electronic Access
Format:
Availability
Online Library~1
Copies:
Author
Nichols, Jonathan Michael, author. Murphy, Kevin D., 1966- author.
Preferred Shelf Number
ONLINE
Electronic Access
Format:
Availability
Online Library~1
Copies:
Author
Follansbee, Paul S., 1950- author.
Preferred Shelf Number
ONLINE(341806.1)
Electronic Access
Format:
Availability
Online Library~1
Copies:
Author
Maiti, C. K. Maiti, T. K.
Preferred Shelf Number
ONLINE
Format:
Availability
Online Library~1
Copies:
Author
Hashiguchi, Koichi. Yamakawa, Yuki.
Preferred Shelf Number
ONLINE
Electronic Access
John Wiley http://dx.doi.org/10.1002/9781118437711
Ebook Library http://public.eblib.com/EBLPublic/PublicView.do?ptiID=1031832
Ebook Library http://public.eblib.com/EBLPublic/PublicView.do?ptiID=1031832
Format:
Availability
Online Library~1
Copies:
Author
Tomm, Jens W. Jim�enez, J. (Juan)
Preferred Shelf Number
ONLINE
Electronic Access
Format:
Availability
Online Library~1
Copies:
Author
Nash, William A. Potter, Merle C.
Preferred Shelf Number
ONLINE
Electronic Access
Format:
Availability
Online Library~1
Copies:
Author
Pitts, Donald R. Sissom, Leighton E.
Preferred Shelf Number
ONLINE
Electronic Access
Format:
Availability
Online Library~1
Copies:
Author
Nash, William A.
Preferred Shelf Number
ONLINE
Electronic Access
Format:
Availability
Online Library~1
Copies:
Author
Hanbücken, Margrit. Müller, Pierre. Wehrspohn, Ralf B. Wiley InterScience (Online service)
Preferred Shelf Number
ONLINE
Electronic Access
Format:
Availability
Online Library~1
Copies:
Author
Huston, Ronald L., 1937- Josephs, Harold. Blake, Alexander. Practical stress analysis in engineering design.
Preferred Shelf Number
ONLINE
Electronic Access
Format:
Availability
Online Library~1
Copies: