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1. 
Cover image for Essentials of electronic testing for digital, memory, and mixed-signal VLSI circuits
Essentials of electronic testing for digital, memory, and mixed-signal VLSI circuits
Author 
Bushnell, Michael L. (Michael Lee), 1950- Agrawal, Vishwani D., 1943-
Preferred Shelf Number 
TK7874.75 B87 2000
Format: 
Availability 
Beytepe Library~1
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2. 
Cover image for Applied formal verification
Applied formal verification
Author 
Perry, Douglas L. Foster, Harry, 1956-
Preferred Shelf Number 
ONLINE
Electronic Access 
Subscription required
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3. 
Cover image for Advances in electronic testing : challenges and methodologies
Advances in electronic testing : challenges and methodologies
Author 
Gizopoulos, Dimitris.
Preferred Shelf Number 
TK7867 .A385 2006
Format: 
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4. 
Cover image for Algorithmic and Knowledge-based CAD for VLSI
Algorithmic and Knowledge-based CAD for VLSI
Author 
Taylor, Gaynor, ed. Russell, Gordon, ed.
Preferred Shelf Number 
ONLINE
Electronic Access 
http://dx.doi.org/10.1049/PBCS004E
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5. 
Cover image for Analogue-digital ASICs Circuit techniques, design tools and applications
Analogue-digital ASICs Circuit techniques, design tools and applications
Author 
Soin, R. S., ed. Maloberti, F., ed. Franca, J., ed.
Preferred Shelf Number 
ONLINE
Electronic Access 
http://dx.doi.org/10.1049/PBCS003E
Format: 
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