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Cover image for Testing for small-delay defects in nanoscale CMOS integrated circuits
Testing for small-delay defects in nanoscale CMOS integrated circuits
Author 
Goel, Sandeep K, editor of compilation. Chakrabarty, Krishnendu, editor of compilation.
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ONLINE(342881.1)
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2. 
Cover image for Defects in microelectronic materials and devices
Defects in microelectronic materials and devices
Author 
Fleetwood, Daniel. Pantelides, Sokrates T. Schrimpf, Ronald Donald.
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ONLINE
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3. 
Cover image for High-speed VLSI interconnections
High-speed VLSI interconnections
Author 
Goel, Ashok K., 1953-
Preferred Shelf Number 
ONLINE
Electronic Access 
IEEE Xplore http://ieeexplore.ieee.org/xpl/bkabstractplus.jsp?bkn=5201516
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