Limit Search Results
Author
SpringerLink (Online service)
(10)
Wiley InterScience (Online service)
(5)
Amelinckx, S. (Severin)
(4)
Cullis, A. G. editor.
(2)
Fultz, Brent. author.
(2)
Language
Publication Date
-
Subject
Material Type
Shelf Location
Library
Switch to list view
Switch to thumbnail view
Select an Action
29 Results Found Subscribe to search results
00000000000000000000000000000DEFAULT
Print
1. 
Cover image for Microscopy of Semiconducting Materials 2007
Microscopy of Semiconducting Materials 2007
Author 
Cullis, A. G. editor. Midgley, P. A. editor. SpringerLink (Online service)
Preferred Shelf Number 
ONLINE
Electronic Access 
http://dx.doi.org/10.1007/978-1-4020-8615-1
Format: 
Availability 
Online Library~1
Available:
Copies:
2. 
Cover image for Transmission Electron Microscopy and Diffractometry of Materials
Transmission Electron Microscopy and Diffractometry of Materials
Author 
Fultz, Brent. author. Howe, James. author. SpringerLink (Online service)
Preferred Shelf Number 
ONLINE(333265.1)
Electronic Access 
http://dx.doi.org/10.1007/978-3-642-29761-8
Format: 
Availability 
Online Library~1
Available:
Copies:
3. 
Cover image for Transmission Electron Microscopy and Diffractometry of Materials
Transmission Electron Microscopy and Diffractometry of Materials
Author 
Fultz, Brent. author. Howe, James M. author. SpringerLink (Online service)
Preferred Shelf Number 
ONLINE
Electronic Access 
http://dx.doi.org/10.1007/978-3-540-73886-2
Format: 
Availability 
Online Library~1
Available:
Copies:
4. 
Cover image for Electron microscopy and structure of materials : proceedings
Electron microscopy and structure of materials : proceedings
Author 
International Materials Symposium (5th : 1971 : University of California, Berkeley) Thomas, Gareth. , ed. Fulrath, Richard M. , ed. Fisher, Robert M., ed. University Conference on Ceramic Science (7th : 1971 : Berkeley)
Preferred Shelf Number 
TA 407 I65 1972
Format: 
Availability 
Beytepe Library~1
Available:
Copies:
5. 
Cover image for Scanning Probe Microscopy of Functional Materials Nanoscale Imaging and Spectroscopy
Scanning Probe Microscopy of Functional Materials Nanoscale Imaging and Spectroscopy
Author 
Kalinin, Sergei V. editor. Gruverman, Alexei. editor. SpringerLink (Online service)
Preferred Shelf Number 
ONLINE
Electronic Access 
http://dx.doi.org/10.1007/978-1-4419-7167-8
Format: 
Availability 
Online Library~1
Available:
Copies:
6. 
Cover image for Transmission Electron Microscopy A Textbook for Materials Science
Transmission Electron Microscopy A Textbook for Materials Science
Author 
Williams, David B. author. Carter, C. Barry. author. SpringerLink (Online service)
Preferred Shelf Number 
ONLINE
Electronic Access 
http://dx.doi.org/10.1007/978-0-387-76501-3
Format: 
Availability 
Online Library~1
Available:
Copies:
7. 
Cover image for EMC 2008 14th European Microscopy Congress 1–5 September 2008, Aachen, Germany Volume 2: Materials Science
EMC 2008 14th European Microscopy Congress 1–5 September 2008, Aachen, Germany Volume 2: Materials Science
Author 
Richter, Silvia. editor. Schwedt, Alexander. editor. SpringerLink (Online service)
Preferred Shelf Number 
ONLINE
Electronic Access 
http://dx.doi.org/10.1007/978-3-540-85226-1
Format: 
Availability 
Online Library~1
Available:
Copies:
8. 
Cover image for Microscopy of Semiconducting Materials Proceedings of the 14th Conference, April 11–14, 2005, Oxford, UK
Microscopy of Semiconducting Materials Proceedings of the 14th Conference, April 11–14, 2005, Oxford, UK
Author 
Cullis, A. G. editor. Hutchison, J. L. editor. SpringerLink (Online service)
Preferred Shelf Number 
ONLINE
Electronic Access 
http://dx.doi.org/10.1007/3-540-31915-8
Format: 
Availability 
Online Library~1
Available:
Copies:
9. 
Cover image for Scanning Probe Microscopy: Characterization, Nanofabrication and Device Application of Functional Materials Proceedings of the NATO Advanced Study Institute on Scanning Probe Microscopy: Characterization, Nanofabrication and Device Application of Functional Materials Algarve, Portugal 1–13 October 2002
Scanning Probe Microscopy: Characterization, Nanofabrication and Device Application of Functional Materials Proceedings of the NATO Advanced Study Institute on Scanning Probe Microscopy: Characterization, Nanofabrication and Device Application of Functional Materials Algarve, Portugal 1–13 October 2002
Author 
Vilarinho, Paula Maria. editor. Rosenwaks, Yossi. editor. Kingon, Angus. editor. SpringerLink (Online service)
Preferred Shelf Number 
ONLINE
Electronic Access 
http://dx.doi.org/10.1007/1-4020-3019-3
Format: 
Availability 
Online Library~1
Available:
Copies:
10. 
Cover image for Characterization of High Tc Materials and Devices by Electron Microscopy
Characterization of High Tc Materials and Devices by Electron Microscopy
Author 
Browning, Nigel D.. Pennycook, Stephen J..
Preferred Shelf Number 
ONLINE
Electronic Access 
Access by subscription
Format: 
Availability 
Online Library~1
Available:
Copies:
11. 
Cover image for Handbook of microscopy applications in materials science, solid-state physics, and chemistry
Handbook of microscopy applications in materials science, solid-state physics, and chemistry
Author 
Amelinckx, S. (Severin) Wiley InterScience (Online service)
Preferred Shelf Number 
ONLINE
Electronic Access 
John Wiley http://dx.doi.org/10.1002/9783527619283
Format: 
Availability 
Online Library~1
Available:
Copies:
12. 
Cover image for Handbook of microscopy applications in materials science, solid-state physics, and chemistry
Handbook of microscopy applications in materials science, solid-state physics, and chemistry
Author 
Amelinckx, S. (Severin) Wiley InterScience (Online service)
Preferred Shelf Number 
ONLINE
Electronic Access 
Wiley InterScience An electronic book accessible through the World Wide Web; click for information
Format: 
Availability 
Online Library~1
Available:
Copies:
13. 
Cover image for Handbook of microscopy applications in materials science, solid-state physics and chemistry. Methods I
Handbook of microscopy applications in materials science, solid-state physics and chemistry. Methods I
Author 
Amelinckx, S. (Severin) Wiley InterScience (Online service)
Preferred Shelf Number 
ONLINE
Electronic Access 
Wiley InterScience An electronic book accessible through the World Wide Web; click for information
Format: 
Availability 
Online Library~1
Available:
Copies:
14. 
Cover image for Handbook of microscopy applications in materials science, solid-state physics and chemistry. Applications
Handbook of microscopy applications in materials science, solid-state physics and chemistry. Applications
Author 
Amelinckx, S. (Severin) Wiley InterScience (Online service)
Preferred Shelf Number 
ONLINE
Electronic Access 
Wiley InterScience An electronic book accessible through the World Wide Web; click for information
Format: 
Availability 
Online Library~1
Available:
Copies:
15. 
Cover image for Electron microscopy in plasticity and fracture research of materials : proceedings of the international symposium held at Holzhau near Dresden, 8 to 13 October 1989
Electron microscopy in plasticity and fracture research of materials : proceedings of the international symposium held at Holzhau near Dresden, 8 to 13 October 1989
Author 
Messerschmidt, U. , ed.
Preferred Shelf Number 
TA 417.35 E43 1990
Format: 
Availability 
Beytepe Library~1
Available:
Copies:
16. 
Cover image for Scanning electron microscopy : applications to materials and device science
Scanning electron microscopy : applications to materials and device science
Author 
Thornton, P. R.
Preferred Shelf Number 
QH 212.E4 T52 1968 1.K
Format: 
Availability 
Health Sciences Library~1
Available:
Copies:
17. 
Cover image for Electron microscopy in heterogeneous catalysis
Electron microscopy in heterogeneous catalysis
Author 
Gai, Pratibha L., 1948- Boyes, E. D. (Edward D.)
Preferred Shelf Number 
ONLINE
Electronic Access 
Distributed by publisher. Purchase or institutional license may be required for access.
Format: 
Availability 
Online Library~1
Available:
Copies:
18. 
Cover image for Characterization of radiation-damage by transmission electron microscopy
Characterization of radiation-damage by transmission electron microscopy
Author 
Jenkins, M. L., 1949- Kirk, M. A., 1942-
Preferred Shelf Number 
ONLINE
Electronic Access 
Distributed by publisher. Purchase or institutional license may be required for access.
Format: 
Availability 
Online Library~1
Available:
Copies:
19. 
Cover image for Atlas of Functional Anatomy for Regional Anesthesia and Pain Medicine Human Structure, Ultrastructure and 3D Reconstruction Images
Atlas of Functional Anatomy for Regional Anesthesia and Pain Medicine Human Structure, Ultrastructure and 3D Reconstruction Images
Author 
Reina, Miguel Angel. editor. De Andrés, José Antonio. editor. Hadzic, Admir. editor. Prats-Galino, Alberto. editor. Sala-Blanch, Xavier. editor.
Preferred Shelf Number 
XX(520074.1)
Electronic Access 
https://doi.org/10.1007/978-3-319-09522-6
Format: 
Availability 
Online Library~1
Available:
Copies:
20. 
Cover image for Fundamentals and applications of ultrasonic waves
Fundamentals and applications of ultrasonic waves
Author 
Cheeke, J. David N.
Preferred Shelf Number 
ONLINE
Electronic Access 
Distributed by publisher. Purchase or institutional license may be required for access.
Format: 
Availability 
Online Library~1
Available:
Copies:
21. 
Cover image for Aberration-corrected analytical transmission electron microscopy
Aberration-corrected analytical transmission electron microscopy
Author 
Brydson, Rik, editor, author.
Preferred Shelf Number 
ONLINE(318971.1)
Electronic Access 
Connect to MyiLibrary resource.
Ebook Library http://public.eblib.com/choice/publicfullrecord.aspx?p=693217
ebrary http://site.ebrary.com/id/10488537
EBSCOhost http://search.ebscohost.com/login.aspx?direct=true&scope=site&db=nlebk&db=nlabk&AN=509882
John Wiley http://dx.doi.org/10.1002/9781119978848
Format: 
Availability 
Online Library~1
Available:
Copies:
22. 
Cover image for Handbook of surface and interface analysis methods for problem-solving
Handbook of surface and interface analysis methods for problem-solving
Author 
Rivir̈e, J. C. Myhra, S. (Sverre), 1943-
Preferred Shelf Number 
ONLINE
Electronic Access 
Distributed by publisher. Purchase or institutional license may be required for access.
Format: 
Availability 
Online Library~1
Available:
Copies:
23. 
Cover image for Nanoscience Nanobiotechnology and Nanobiology
Nanoscience Nanobiotechnology and Nanobiology
Author 
Boisseau, Patrick. editor. Houdy, Philippe. editor. Lahmani, Marcel. editor. SpringerLink (Online service)
Preferred Shelf Number 
ONLINE
Electronic Access 
http://dx.doi.org/10.1007/978-3-540-88633-4
Format: 
Availability 
Online Library~1
Available:
Copies:
24. 
Cover image for Microstructural characterization of materials
Microstructural characterization of materials
Author 
Brandon, D. G. Kaplan, Wayne D. Wiley InterScience (Online service)
Preferred Shelf Number 
ONLINE
Electronic Access 
Online text
http://onlinelibrary.wiley.com/book/10.1002/9780470727133
Ebook Library http://public.eblib.com/EBLPublic/PublicView.do?ptiID=470287
John Wiley http://dx.doi.org/10.1002/9780470727133
MyiLibrary, Table of contents http://www.myilibrary.com?id=234294&ref=toc
Format: 
Availability 
Online Library~1
Available:
Copies:
25. 
Cover image for Carbon nanotubes properties and applications
Carbon nanotubes properties and applications
Author 
O'Connell, Michael (Michael J.)
Preferred Shelf Number 
ONLINE
Electronic Access 
Distributed by publisher. Purchase or institutional license may be required for access.
Format: 
Availability 
Online Library~1
Available:
Copies:
26. 
Cover image for Mechanical tribology materials, characterization, and applications
Mechanical tribology materials, characterization, and applications
Author 
Totten, George E. Liang, Hong.
Preferred Shelf Number 
ONLINE
Electronic Access 
Distributed by publisher. Purchase or institutional license may be required for access.
Format: 
Availability 
Online Library~1
Available:
Copies:
27. 
Cover image for Transmission electron energy loss spectrometry in materials science and the EELS atlas
Transmission electron energy loss spectrometry in materials science and the EELS atlas
Author 
Ahn, C. C. (Channing C.) John Wiley & Sons.
Preferred Shelf Number 
ONLINE
Electronic Access 
John Wiley http://dx.doi.org/10.1002/3527605495
Format: 
Availability 
Online Library~1
Available:
Copies:
28. 
Cover image for Industrial applications of electron microscopy
Industrial applications of electron microscopy
Author 
Li, Zhigang R., 1958-
Preferred Shelf Number 
ONLINE
Electronic Access 
Distributed by publisher. Purchase or institutional license may be required for access.
Format: 
Availability 
Online Library~1
Available:
Copies:
29. 
Cover image for Nano and microstructural design of advanced materials a commemorative volume on Professor G. Thomas' seventieth birthday
Nano and microstructural design of advanced materials a commemorative volume on Professor G. Thomas' seventieth birthday
Author 
Thomas, Gareth, 1932- Meyers, Marc A. Ritchie, R. O. (Robert O.) Sarikaya, Mehmet.
Preferred Shelf Number 
ONLINE
Electronic Access 
ScienceDirect http://www.sciencedirect.com/science/book/9780080443737
Format: 
Availability 
Online Library~1
Available:
Copies: