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1. 
Cover image for Metrology
Metrology
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Gao, Wei. editor. SpringerLink (Online service)
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https://doi.org/10.1007/978-981-10-4938-5
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Cover image for Mass Metrology
Mass Metrology
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Gupta, S. V. author. SpringerLink (Online service)
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http://dx.doi.org/10.1007/978-3-642-23412-5
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3. 
Cover image for Optical metrology
Optical metrology
Author 
Gåsvik, Kjell J.
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Cover image for Optical metrology
Optical metrology
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Gåsvik, Kjell J. John Wiley & Sons.
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5. 
Cover image for Speckle metrology
Speckle metrology
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Erf, Robert K.
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6. 
Cover image for Comprehensive mass metrology
Comprehensive mass metrology
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Kochsiek, Manfred. Gläser, Michael, 1942- John Wiley & Sons.
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7. 
Cover image for Metrology for engineers
Metrology for engineers
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Galyer, J. F. W. Shotbolt, C. R., ort. yaz.
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T 50 G3 1980
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8. 
Cover image for Ultra-fast material metrology
Ultra-fast material metrology
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Horn, Alexander, PD Dr.
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9. 
Cover image for Handbook of optical dimensional metrology
Handbook of optical dimensional metrology
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Harding, Kevin G.
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10. 
Cover image for Instrumentation and metrology in oceanography
Instrumentation and metrology in oceanography
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Le Menn, Marc.
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11. 
Cover image for Optical imaging and metrology advanced technologies
Optical imaging and metrology advanced technologies
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Osten, Wolfgang. Reingand, Nadya.
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12. 
Cover image for Semiconductor strain metrology principles and applications
Semiconductor strain metrology principles and applications
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Wong, Terence K. S.
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13. 
Cover image for Information Modeling for Interoperable Dimensional Metrology
Information Modeling for Interoperable Dimensional Metrology
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Zhao, Yaoyao (Fiona). author. Brown, Robert. author. Kramer, Thomas R. author. Xu, Xun. author. SpringerLink (Online service)
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14. 
Cover image for Springer Handbook of Metrology and Testing
Springer Handbook of Metrology and Testing
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Czichos, Horst. editor. Saito, Tetsuya. editor. Smith, Leslie. editor. SpringerLink (Online service)
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15. 
Cover image for Software metrics and software metrology
Software metrics and software metrology
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Abran, Alain, 1949-
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16. 
Cover image for Computational Surface and Roundness Metrology
Computational Surface and Roundness Metrology
Author 
Muralikrishnan, Bala. author. Raja, Jay. author. SpringerLink (Online service)
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17. 
Cover image for X-ray metrology in semiconductor manufacturing
X-ray metrology in semiconductor manufacturing
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Bowen, D. Keith (David Keith), 1940- Tanner, B. K. (Brian Keith)
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18. 
Cover image for Handbook of silicon semiconductor metrology
Handbook of silicon semiconductor metrology
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Diebold, A. C. (Alain C.)
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19. 
Cover image for Metrology for Fire Experiments in Outdoor Conditions
Metrology for Fire Experiments in Outdoor Conditions
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Silvani, Xavier. author. SpringerLink (Online service)
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20. 
Cover image for Graphene Nanoelectronics Metrology, Synthesis, Properties and Applications
Graphene Nanoelectronics Metrology, Synthesis, Properties and Applications
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Raza, Hassan. editor. SpringerLink (Online service)
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21. 
Cover image for Digital holography for MEMS and microsystem metrology
Digital holography for MEMS and microsystem metrology
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Asundi, Anand.
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22. 
Cover image for Advances in speckle metrology and related techniques
Advances in speckle metrology and related techniques
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Kaufmann, Guillermo H.
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Wiley InterScience An electronic book accessible through the World Wide Web; click for information
Wiley InterScience - Full Text Online http://onlinelibrary.wiley.com/book/10.1002/9783527633852
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23. 
Cover image for Distributed Large-Scale Dimensional Metrology New Insights
Distributed Large-Scale Dimensional Metrology New Insights
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Franceschini, Fiorenzo. author. Galetto, Maurizio. author. Maisano, Domenico. author. Mastrogiacomo, Luca. author. Pralio, Barbara. author.
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24. 
Cover image for Handbook of optical metrology principles and applications
Handbook of optical metrology principles and applications
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Yoshizawa, T?ru, 1939-
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25. 
Cover image for Metrology in industry the key for quality
Metrology in industry the key for quality
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Collège français de métrologie. Wiley InterScience (Online service)
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Contributor biographical information http://catdir.loc.gov/catdir/enhancements/fy0806/2006003530-b.html
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26. 
Cover image for Transverse disciplines in metrology proceedings of the 13th International Metrology Congress, 2007, Lille, France
Transverse disciplines in metrology proceedings of the 13th International Metrology Congress, 2007, Lille, France
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International Metrology Conference (13th : 2007 : French College of Metrology) Collège français de métrologie. Wiley InterScience (Online service)
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27. 
Cover image for Advances in Manufacturing II Volume 5 - Metrology and Measurement Systems
Advances in Manufacturing II Volume 5 - Metrology and Measurement Systems
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Diering, Magdalena. editor. Wieczorowski, Michał. editor. Brown, Christopher A. editor. SpringerLink (Online service)
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28. 
Cover image for Metrology and standardization of nanotechnology : protocols and industrial innovations
Metrology and standardization of nanotechnology : protocols and industrial innovations
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Mansfield, Elisabeth, editor. Kaiser, Debra L., editor. Fujita, Daisuke, editor. Voorde, M. H. van de (Marcel H.), editor.
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29. 
Cover image for Forensic metrology : scientific measurement and inference for lawyers, judges and criminalists
Forensic metrology : scientific measurement and inference for lawyers, judges and criminalists
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Vosk, Ted, author. Emery, A. F. (Ashley Francis), 1934- author.
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30. 
Cover image for Fringe pattern analysis for optical metrology : theory, algorithms, and applications
Fringe pattern analysis for optical metrology : theory, algorithms, and applications
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Servín, Manuel, author. Quiroga, J. Antonio (Juan Antonio), author. Padilla, J. Moisés (José Moisés), author.
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31. 
Cover image for Fringe 2013 7th International Workshop on Advanced Optical Imaging and Metrology
Fringe 2013 7th International Workshop on Advanced Optical Imaging and Metrology
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Osten, Wolfgang. editor. SpringerLink (Online service)
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32. 
Cover image for Performance-based gear metrology kinematic-transmission-error computation and diagnosis
Performance-based gear metrology kinematic-transmission-error computation and diagnosis
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Mark, William D.
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Cover image for Laser metrology in fluid mechanics granulometry, temperature and concentration measurements
Laser metrology in fluid mechanics granulometry, temperature and concentration measurements
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Boutier, A. (Alain)
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Cover image for Handbook of 3D machine vision optical metrology and imaging
Handbook of 3D machine vision optical metrology and imaging
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Song, Zhang.
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Cover image for A practical guide to optical metrology for thin films
A practical guide to optical metrology for thin films
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Quinten, Michael.
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36. 
Cover image for Optical Measurements, Modeling, and Metrology, Volume 5 Proceedings of the 2011 Annual Conference on Experimental and Applied Mechanics
Optical Measurements, Modeling, and Metrology, Volume 5 Proceedings of the 2011 Annual Conference on Experimental and Applied Mechanics
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Proulx, Tom. editor. SpringerLink (Online service)
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Cover image for The Physics of Metrology All about Instruments: From Trundle Wheels to Atomic Clocks
The Physics of Metrology All about Instruments: From Trundle Wheels to Atomic Clocks
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Hebra, Alexius J. author. SpringerLink (Online service)
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Cover image for Data Modeling for Metrology and Testing in Measurement Science
Data Modeling for Metrology and Testing in Measurement Science
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Pavese, Franco. editor. Forbes, Alistair B. editor. SpringerLink (Online service)
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39. 
Cover image for Fringe 2009 6th International Workshop on Advanced Optical Metrology
Fringe 2009 6th International Workshop on Advanced Optical Metrology
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Osten, Wolfgang. editor. Kujawinska, Malgorzata. editor. SpringerLink (Online service)
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Cover image for Quality Assurance for Chemistry and Environmental Science Metrology from pH Measurement to Nuclear Waste Disposal
Quality Assurance for Chemistry and Environmental Science Metrology from pH Measurement to Nuclear Waste Disposal
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Meinrath, G. author. Schneider, Petra. author. SpringerLink (Online service)
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Cover image for Microwave Circuit Theory and Foundations of Microwave Metrology
Microwave Circuit Theory and Foundations of Microwave Metrology
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Engen, Glenn F.
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42. 
Cover image for Handbook of surface and nanometrology
Handbook of surface and nanometrology
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Whitehouse, D. J. (David J.) Whitehouse, D. J. (David J.). Handbook of surface metrology.
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Cover image for Handbook of surface and nanometrology
Handbook of surface and nanometrology
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Whitehouse, D. J. (David J.) Whitehouse, D. J. (David J.). Handbook of surface metrology.
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Clinical and Laboratory Medicine Textbook
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Ciaccio, Marcello. editor. SpringerLink (Online service)
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Cover image for Pattern Recognition and Image Analysis 7th Iberian Conference, IbPRIA 2015, Santiago de Compostela, Spain, June 17-19, 2015, Proceedings
Pattern Recognition and Image Analysis 7th Iberian Conference, IbPRIA 2015, Santiago de Compostela, Spain, June 17-19, 2015, Proceedings
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Paredes, Roberto. editor. Cardoso, Jaime S. editor. Pardo, Xosé M. editor. SpringerLink (Online service)
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Cover image for Pattern Recognition and Machine Intelligence 6th International Conference, PReMI 2015, Warsaw, Poland, June 30 - July 3, 2015, Proceedings
Pattern Recognition and Machine Intelligence 6th International Conference, PReMI 2015, Warsaw, Poland, June 30 - July 3, 2015, Proceedings
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Kryszkiewicz, Marzena. editor. Bandyopadhyay, Sanghamitra. editor. Rybinski, Henryk. editor. Pal, Sankar K. editor. SpringerLink (Online service)
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Cover image for Integrated Imaging and Vision Techniques for Industrial Inspection Advances and Applications
Integrated Imaging and Vision Techniques for Industrial Inspection Advances and Applications
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Liu, Zheng. editor. Ukida, Hiroyuki. editor. Ramuhalli, Pradeep. editor. Niel, Kurt. editor. SpringerLink (Online service)
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Cover image for Optical devices in ophthalmology and optometry technology, design principles and clinical applications
Optical devices in ophthalmology and optometry technology, design principles and clinical applications
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Donnerhacke, Karl-Heinz. Rill, Michael Stefan. Kaschke, Michael F.
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49. 
Cover image for Yasal metroloji
Yasal metroloji
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50. 
Cover image for Electrical impedance principles, measurement, and applications
Electrical impedance principles, measurement, and applications
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Callegaro, Luca.
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Cover image for 100 years of superconductivity
100 years of superconductivity
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Rogalla, H. (Horst) Kes, P. H. (Peter H.)
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Cover image for Coordinate measuring machines and systems
Coordinate measuring machines and systems
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Hocken, Robert J. Pereira, Paulo H.
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Cover image for Compound semiconductor radiation detectors
Compound semiconductor radiation detectors
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Owens, Alan.
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Cover image for Measurements with persons theory, methods, and implementation areas
Measurements with persons theory, methods, and implementation areas
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Berglund, Birgitta.
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Cover image for Fundamentals of laser micromachining
Fundamentals of laser micromachining
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Schaeffer, Ronald D.
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Cover image for Computer network time synchronization the Network Time Protocol on Earth and in space
Computer network time synchronization the Network Time Protocol on Earth and in space
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Mills, David L.
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Cover image for Fundamental principles of engineering nanometrology
Fundamental principles of engineering nanometrology
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Leach, R. K.
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Cover image for Handbook of photonics for biomedical science
Handbook of photonics for biomedical science
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Tuchin, V. V. (Valeri? Viktorovich)
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Cover image for Fundamental principles of engineering nanometrology
Fundamental principles of engineering nanometrology
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Leach, R. K.
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Cover image for Computer network time synchronization the network time protocol
Computer network time synchronization the network time protocol
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Mills, David L.
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