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1. 
Cover image for Metrology
Metrology
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Gao, Wei. editor. SpringerLink (Online service)
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https://doi.org/10.1007/978-981-10-4938-5
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Cover image for Dimensional metrology
Dimensional metrology
Author 
Haitjema, Han, author. Leach, Richard, author.
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QC88
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Taylor & Francis https://www.taylorfrancis.com/books/9780367821746
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Cover image for Mass Metrology
Mass Metrology
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Gupta, S. V. author. SpringerLink (Online service)
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Cover image for Optical metrology
Optical metrology
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Gåsvik, Kjell J. John Wiley & Sons.
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Cover image for Optical metrology
Optical metrology
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Gåsvik, Kjell J.
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Cover image for Speckle metrology
Speckle metrology
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Erf, Robert K.
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Cover image for Comprehensive mass metrology
Comprehensive mass metrology
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Kochsiek, Manfred. Gläser, Michael, 1942- John Wiley & Sons.
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Cover image for Metrology for engineers
Metrology for engineers
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Galyer, J. F. W. Shotbolt, C. R., ort. yaz.
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T 50 G3 1980
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9. 
Cover image for ULTRAPRECISION MACHINING AND METROLOGY
ULTRAPRECISION MACHINING AND METROLOGY
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Yan, Jiwang.
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QC88
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10. 
Cover image for INTRODUCTION TO OPTICAL METROLOGY
INTRODUCTION TO OPTICAL METROLOGY
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Sirohi, R. S.
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QC367
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11. 
Cover image for Ultra-fast material metrology
Ultra-fast material metrology
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Horn, Alexander, PD Dr.
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Cover image for Handbook of Metrology and Applications
Handbook of Metrology and Applications
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Aswal, Dinesh K. editor. Yadav, Sanjay. editor. Takatsuji, Toshiyuki. editor. Rachakonda, Prem. editor. Kumar, Harish. editor.
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13. 
Cover image for Characterization, testing, measurement, and metrology
Characterization, testing, measurement, and metrology
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Prakash, Chander, editor. Singh, Sunpreet, 1989- editor. Davim, J. Paulo, editor.
Preferred Shelf Number 
TA410 .C457 2021
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14. 
Cover image for Machine Tool Metrology An Industrial Handbook
Machine Tool Metrology An Industrial Handbook
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Smith, Graham T. author. SpringerLink (Online service)
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https://doi.org/10.1007/978-3-319-25109-7
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15. 
Cover image for Handbook of optical dimensional metrology
Handbook of optical dimensional metrology
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Harding, Kevin G.
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T50 .H268 2013
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16. 
Cover image for Instrumentation and metrology in oceanography
Instrumentation and metrology in oceanography
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Le Menn, Marc.
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17. 
Cover image for Semiconductor strain metrology principles and applications
Semiconductor strain metrology principles and applications
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Wong, Terence K. S.
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18. 
Cover image for Optical imaging and metrology advanced technologies
Optical imaging and metrology advanced technologies
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Osten, Wolfgang. Reingand, Nadya.
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Cover image for Springer Handbook of Metrology and Testing
Springer Handbook of Metrology and Testing
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Czichos, Horst. editor. Saito, Tetsuya. editor. Smith, Leslie. editor. SpringerLink (Online service)
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Cover image for Information Modeling for Interoperable Dimensional Metrology
Information Modeling for Interoperable Dimensional Metrology
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Zhao, Yaoyao (Fiona). author. Brown, Robert. author. Kramer, Thomas R. author. Xu, Xun. author. SpringerLink (Online service)
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Cover image for Software metrics and software metrology
Software metrics and software metrology
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Abran, Alain, 1949-
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Cover image for Computational Surface and Roundness Metrology
Computational Surface and Roundness Metrology
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Muralikrishnan, Bala. author. Raja, Jay. author. SpringerLink (Online service)
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23. 
Cover image for X-ray metrology in semiconductor manufacturing
X-ray metrology in semiconductor manufacturing
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Bowen, D. Keith (David Keith), 1940- author. Tanner, B. K. (Brian Keith)
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TK7874.58 .B69 2006
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Cover image for Handbook of silicon semiconductor metrology
Handbook of silicon semiconductor metrology
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Diebold, A. C. (Alain C.)
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TK7871.85 .H3337 2001
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25. 
Cover image for Metrology and Measurement Uncertainty Concepts and Applications
Metrology and Measurement Uncertainty Concepts and Applications
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Novellino do Rosario, Pedro Paulo. author. Mendes, Alexandre. author. SpringerLink (Online service)
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Cover image for Coordinate Metrology Accuracy of Systems and Measurements
Coordinate Metrology Accuracy of Systems and Measurements
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Sładek, Jerzy A. author. SpringerLink (Online service)
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27. 
Cover image for Metrology for Fire Experiments in Outdoor Conditions
Metrology for Fire Experiments in Outdoor Conditions
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Silvani, Xavier. author. SpringerLink (Online service)
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28. 
Cover image for Graphene Nanoelectronics Metrology, Synthesis, Properties and Applications
Graphene Nanoelectronics Metrology, Synthesis, Properties and Applications
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Raza, Hassan. editor. SpringerLink (Online service)
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29. 
Cover image for Advances in speckle metrology and related techniques
Advances in speckle metrology and related techniques
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Kaufmann, Guillermo H.
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Wiley InterScience An electronic book accessible through the World Wide Web; click for information
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Cover image for Digital holography for MEMS and microsystem metrology
Digital holography for MEMS and microsystem metrology
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Asundi, Anand.
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31. 
Cover image for Distributed Large-Scale Dimensional Metrology New Insights
Distributed Large-Scale Dimensional Metrology New Insights
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Franceschini, Fiorenzo. author. Galetto, Maurizio. author. Maisano, Domenico. author. Mastrogiacomo, Luca. author. Pralio, Barbara. author.
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32. 
Cover image for Handbook of optical metrology : principles and applications
Handbook of optical metrology : principles and applications
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Yoshizawa, Toru, 1939-
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QC367 .H36 2009
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Cover image for Metrology in industry the key for quality
Metrology in industry the key for quality
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Collège français de métrologie. Wiley InterScience (Online service)
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34. 
Cover image for Transverse disciplines in metrology proceedings of the 13th International Metrology Congress, 2007, Lille, France
Transverse disciplines in metrology proceedings of the 13th International Metrology Congress, 2007, Lille, France
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International Metrology Conference (13th : 2007 : French College of Metrology) Collège français de métrologie. Wiley InterScience (Online service)
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Cover image for Advances in Biophotonics, Nanofabrication, Optical Metrology and Nonlinear and Ultrafast Photonics Proceedings of PHOTONICS 2023, Volume 3
Advances in Biophotonics, Nanofabrication, Optical Metrology and Nonlinear and Ultrafast Photonics Proceedings of PHOTONICS 2023, Volume 3
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Prakash, Jaya. editor. Basu, Jaydeep Kumar. editor. Mukherjee, Sebabrata. editor. Chandrashekar, C. M. editor. (orcid)0000-0003-4820-2317 SpringerLink (Online service)
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Cover image for Advances in Metrology Select Proceedings of AdMet 2024
Advances in Metrology Select Proceedings of AdMet 2024
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Yadav, Sanjay. editor. Garg, Naveen. editor. Kumar, Mukesh. editor. Aggarwal, Shankar G. editor. Jaiswal, Shiv Kumar. editor.
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Cover image for Recent Advances in Metrology Select Proceedings of AdMet 2022
Recent Advances in Metrology Select Proceedings of AdMet 2022
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Yadav, Sanjay. editor. (orcid)0000-0002-1450-3202 Garg, Naveen. editor. Aggarwal, Shankar G. editor. (orcid)0000-0002-5809-157X Jaiswal, Shiv Kumar. editor. Kumar, Harish. editor.
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Cover image for High-productivity drilling tools. Materials, metrology, and failure analysis
High-productivity drilling tools. Materials, metrology, and failure analysis
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Astakhov, Viktor P., author.
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TJ1260
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Cover image for Recent Advances in Metrology Select Proceedings of AdMet 2021
Recent Advances in Metrology Select Proceedings of AdMet 2021
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Yadav, Sanjay. editor. Chaudhary, K.P. editor. Gahlot, Ajay. editor. Arya, Yogendra. editor. Dahiya, Aman. editor.
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Cover image for Metrology and instrumentation : practical applications for engineering and manufacturing
Metrology and instrumentation : practical applications for engineering and manufacturing
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Mekid, Samir, author.
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QC88 .M38 2022
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Cover image for The economics and science of measurement : a study of metrology
The economics and science of measurement : a study of metrology
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Link, Albert N., author.
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QC91
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42. 
Cover image for Handbook of Laser Technology and Applications Laser Applications: Medical, Metrology and Communication. (Volume Four)
Handbook of Laser Technology and Applications Laser Applications: Medical, Metrology and Communication. (Volume Four)
Author 
Guo, Chunlei, editor. Singh, Subhash Chandra (Writer on technology), editor.
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TK7871.3
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43. 
Cover image for Modern characterization of electromagnetic systems and its associated metrology
Modern characterization of electromagnetic systems and its associated metrology
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Sarkar, Tapan (Tapan K.), editor. Salazar-Palma, Magdalena, editor. Zhu, Ming Da, editor. Chen, Heng, 1990- editor.
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QC760 .M53 2021
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44. 
Cover image for Applications and metrology at nanometer scale. 1, Smart materials, electromagnetic waves and uncertainties
Applications and metrology at nanometer scale. 1, Smart materials, electromagnetic waves and uncertainties
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Dahoo, Pierre Richard. Pougnet, Philippe. El Hami, Abdelkhalak.
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Cover image for Applications and metrology at nanometer scale. 2, Measurement systems, quantum engineering and RBDO method
Applications and metrology at nanometer scale. 2, Measurement systems, quantum engineering and RBDO method
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Dahoo, Pierre Richard, author. Pougnet, Philippe, author. El Hami, Abdelkhalak, author.
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QC88
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Cover image for Advances in Manufacturing II Volume 5 - Metrology and Measurement Systems
Advances in Manufacturing II Volume 5 - Metrology and Measurement Systems
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Diering, Magdalena. editor. Wieczorowski, Michał. editor. Brown, Christopher A. editor. SpringerLink (Online service)
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Cover image for The new International System of Units (SI) : quantum metrology and quantum standards
The new International System of Units (SI) : quantum metrology and quantum standards
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Göbel, Ernst O., author. Siegner, Uwe, author.
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QC91 .G63 2019
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Cover image for Metrology and standardization of nanotechnology : protocols and industrial innovations
Metrology and standardization of nanotechnology : protocols and industrial innovations
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Mansfield, Elisabeth, editor. Kaiser, Debra L., editor. Fujita, Daisuke, editor. Voorde, M. H. van de (Marcel H.), editor.
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Cover image for Metrology and standardization of nanotechnology : protocols and industrial innovations
Metrology and standardization of nanotechnology : protocols and industrial innovations
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Mansfield, Elisabeth, (Research chemist), editor. Kaiser, Debra L., editor. Fujita, Daisuke (Materials scientist), editor. Voorde, M. H. van de (Marcel H.), editor.
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T174.7
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50. 
Cover image for Forensic metrology : scientific measurement and inference for lawyers, judges and criminalists
Forensic metrology : scientific measurement and inference for lawyers, judges and criminalists
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Vosk, Ted, author. Emery, A. F. (Ashley Francis), 1934- author.
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HV8073.5 .V67 2015
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51. 
Cover image for Fringe 2013 7th International Workshop on Advanced Optical Imaging and Metrology
Fringe 2013 7th International Workshop on Advanced Optical Imaging and Metrology
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Osten, Wolfgang. editor. SpringerLink (Online service)
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https://doi.org/10.1007/978-3-642-36359-7
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52. 
Cover image for Fringe pattern analysis for optical metrology : theory, algorithms, and applications
Fringe pattern analysis for optical metrology : theory, algorithms, and applications
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Servín, Manuel, author. Quiroga, J. Antonio (Juan Antonio), author. Padilla, J. Moisés (José Moisés), author.
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53. 
Cover image for Performance-based gear metrology kinematic-transmission-error computation and diagnosis
Performance-based gear metrology kinematic-transmission-error computation and diagnosis
Author 
Mark, William D.
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54. 
Cover image for Laser metrology in fluid mechanics granulometry, temperature and concentration measurements
Laser metrology in fluid mechanics granulometry, temperature and concentration measurements
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Boutier, A. (Alain)
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55. 
Cover image for Handbook of 3D machine vision : optical metrology and imaging
Handbook of 3D machine vision : optical metrology and imaging
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Song, Zhang.
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TK8315 .H36 2013
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56. 
Cover image for A practical guide to optical metrology for thin films
A practical guide to optical metrology for thin films
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Quinten, Michael.
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57. 
Cover image for Optical Measurements, Modeling, and Metrology, Volume 5 Proceedings of the 2011 Annual Conference on Experimental and Applied Mechanics
Optical Measurements, Modeling, and Metrology, Volume 5 Proceedings of the 2011 Annual Conference on Experimental and Applied Mechanics
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Proulx, Tom. editor. SpringerLink (Online service)
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58. 
Cover image for The Physics of Metrology All about Instruments: From Trundle Wheels to Atomic Clocks
The Physics of Metrology All about Instruments: From Trundle Wheels to Atomic Clocks
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Hebra, Alexius J. author. SpringerLink (Online service)
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http://dx.doi.org/10.1007/978-3-211-78381-8
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Data Modeling for Metrology and Testing in Measurement Science
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Pavese, Franco. editor. Forbes, Alistair B. editor. SpringerLink (Online service)
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Fringe 2009 6th International Workshop on Advanced Optical Metrology
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Osten, Wolfgang. editor. Kujawinska, Malgorzata. editor. SpringerLink (Online service)
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Cover image for Quality Assurance for Chemistry and Environmental Science Metrology from pH Measurement to Nuclear Waste Disposal
Quality Assurance for Chemistry and Environmental Science Metrology from pH Measurement to Nuclear Waste Disposal
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Meinrath, G. author. Schneider, Petra. author. SpringerLink (Online service)
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Microwave Circuit Theory and Foundations of Microwave Metrology
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Engen, Glenn F.
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Handbook of surface and nanometrology
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Whitehouse, D. J. (David J.), author. Whitehouse, D. J. (David J.). Handbook of surface metrology.
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Handbook of surface and nanometrology
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Whitehouse, D. J. (David J.), author. Whitehouse, D. J. (David J.). Handbook of surface metrology.
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Cover image for Psychometrics, Test Theory, and the Latent Factors Model.
Psychometrics, Test Theory, and the Latent Factors Model.
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Blahus, Pet. Blahus, Petr/Brown, Bruce L. Bunderson, C. Victor.
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Cover image for Information-Measuring Systems Theory and Application
Information-Measuring Systems Theory and Application
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Babak, Vitalii. author. Babak, Serhii. author. Eremenko, Volodymyr. author. Kuts, Yurii. author. Zaporozhets, Artur. author. (orcid)0000-0002-0704-4116
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Cover image for XXIX Brazilian Congress on Biomedical Engineering - Volume 2: Tissue Engineering, Clinical Engineering and Computational Modeling in Biomedical Engineering Proceedings of CBEB 2024, September 2-6, 2024, Ribeirão Preto-SP, Brazil
XXIX Brazilian Congress on Biomedical Engineering - Volume 2: Tissue Engineering, Clinical Engineering and Computational Modeling in Biomedical Engineering Proceedings of CBEB 2024, September 2-6, 2024, Ribeirão Preto-SP, Brazil
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Soares, Alcimar Barbosa. editor. (orcid)0000-0003-1100-3533 Leoni, Renata Ferranti. editor. (orcid)0000-0002-4568-0746 Cardoso, George Cunha. editor. (orcid)0000-0001-8459-9812 SpringerLink (Online service)
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Handbook of Vibroacoustics, Noise and Harshness
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Garg, Naveen. editor. Gautam, Chitra. editor. (orcid)0000-0003-3369-0012 Rab, Shanay. editor. (orcid)0000-0003-1203-6492 Wan, Meher. editor. Agarwal, Ravinder. editor.
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Cover image for Faraday Laser A Frequency-Stabilized Diode Laser Based on Faraday Atomic Optical Filters
Faraday Laser A Frequency-Stabilized Diode Laser Based on Faraday Atomic Optical Filters
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Chen, Jingbiao. author. (orcid)0000-0001-9802-4577 Shi, Tiantian. author. (orcid)0000-0001-9714-0445 Pan, Duo. author. (orcid)0000-0001-7794-8922 Ge, Zheyi. author. (orcid)0009-0002-9490-7684 Zhang, Jia. author. (orcid)0000-0001-8682-8287
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Molecular Epidemiology for Infectious Diseases An Introduction to Understanding and Interpreting Molecular Epidemiology
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Field, Nigel. editor. Oeser, Clarissa. editor. Coltart, Cordelia E. M. editor. Bailey, Heather. editor. Shahmanesh, Maryam. editor.
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Accuracy and Calibration Failures in Science and Engineering.
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Holloway, Michael D.
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Cover image for Computer vision & laser vibrometry. Volume 6
Computer vision & laser vibrometry. Volume 6
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International Modal Analysis Conference (41st : 2023) Baqersad, Javad, editor. Di Maio, Dario, editor.
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Biomedical devices and sensors
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Cover image for Selected Topics in Manufacturing Emerging Trends from the Perspective of AITeM's Young Researchers
Selected Topics in Manufacturing Emerging Trends from the Perspective of AITeM's Young Researchers
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Carrino, Luigi. editor. Galantucci, Luigi Maria. editor. (orcid)0000-0003-2892-7433 Settineri, Luca. editor. (orcid)0000-0002-5816-170X SpringerLink (Online service)
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Cover image for Computer Vision & Laser Vibrometry, Volume 6 Proceedings of the 41st IMAC, A Conference and Exposition on Structural Dynamics 2023
Computer Vision & Laser Vibrometry, Volume 6 Proceedings of the 41st IMAC, A Conference and Exposition on Structural Dynamics 2023
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Baqersad, Javad. editor. Di Maio, Dario. editor. (orcid)0000-0002-5794-4702 SpringerLink (Online service)
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Cover image for Dynamic Environments Testing, Volume 7 Proceedings of the 41st IMAC, A Conference and Exposition on Structural Dynamics 2023
Dynamic Environments Testing, Volume 7 Proceedings of the 41st IMAC, A Conference and Exposition on Structural Dynamics 2023
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Cover image for Notes for Manufacturing Instructors From Class to Workshop
Notes for Manufacturing Instructors From Class to Workshop
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Carou, Diego. editor. (orcid)0000-0002-6395-304X Davim, J. Paulo. editor. SpringerLink (Online service)
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Artificial Intelligence in Manufacturing Enabling Intelligent, Flexible and Cost-Effective Production Through AI
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Cover image for Proceedings of Third International Conference in Mechanical and Energy Technology ICMET 2023, India
Proceedings of Third International Conference in Mechanical and Energy Technology ICMET 2023, India
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Yadav, Sanjay. editor. Arora, P. K. editor. Sharma, Anuj Kumar. editor. (orcid)0000-0003-2680-4720 Kumar, Harish. editor. SpringerLink (Online service)
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Cover image for Advances in Manufacturing IV Volume 4 - Measurement and Control Systems: Digitalization, Sustainability and Industry Applications
Advances in Manufacturing IV Volume 4 - Measurement and Control Systems: Digitalization, Sustainability and Industry Applications
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Diering, Magdalena. editor. Wieczorowski, Michał. editor. (orcid)0000-0001-7526-8368 Harugade, Mukund. editor. SpringerLink (Online service)
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Advances in Manufacturing and Materials Select Proceedings of FLUTE 2023
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Kumar, Ravinder. editor. Phanden, Rakesh Kumar. editor. (orcid)0000-0003-3900-9048 Tyagi, R. K. editor. (orcid)0009-0009-2201-6453 Ramkumar, J. editor. (orcid)0000-0002-3578-7283 SpringerLink (Online service)
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Drug Development Supported by Informatics
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Cover image for Some complex phenomena in fluid and solid mechanics
Some complex phenomena in fluid and solid mechanics
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Saouab, Abdelghani, editor. Champmartin, Stéphane, editor. Naciri, Jaafar Khalid, editor. Ambari, Abdelhak, honoree.
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Cover image for Machine Learning for Cyber-Physical Systems Selected papers from the International Conference ML4CPS 2023
Machine Learning for Cyber-Physical Systems Selected papers from the International Conference ML4CPS 2023
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Niggemann, Oliver. editor. Beyerer, Jürgen. editor. Krantz, Maria. editor. Kühnert, Christian. editor. SpringerLink (Online service)
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Advances in Applied Mechanics Select Proceedings of INCAM 2022
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Kumar, Deepak. editor. (orcid)0000-0002-0760-1672 Sahoo, Vineet. editor. (orcid)0000-0001-8365-4031 Mandal, Ashok Kumar. editor. Shukla, Karunesh Kumar. editor. SpringerLink (Online service)
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Di Maio, Dario. editor. Baqersad, Javad. editor. SpringerLink (Online service)
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Proceedings of CASICAM 2022
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Cover image for Sensors and Instrumentation, Aircraft/Aerospace and Dynamic Environments Testing, Volume 7 Proceedings of the 40th IMAC, A Conference and Exposition on Structural Dynamics 2022
Sensors and Instrumentation, Aircraft/Aerospace and Dynamic Environments Testing, Volume 7 Proceedings of the 40th IMAC, A Conference and Exposition on Structural Dynamics 2022
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Walber, Chad. editor. Stefanski, Matthew. editor. Harvie, Julie. editor. SpringerLink (Online service)
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Cover image for Recent Trends in Product Design and Intelligent Manufacturing Systems Select Proceedings of IPDIMS 2021
Recent Trends in Product Design and Intelligent Manufacturing Systems Select Proceedings of IPDIMS 2021
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Deepak, B.B.V.L. editor. Bahubalendruni, M.V.A. Raju. editor. Parhi, D.R.K. editor. Biswal, Bibhuti Bhusan. editor. SpringerLink (Online service)
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Halal and Kosher Food Integration of Quality and Safety for Global Market Trends
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Ahmed Osman, Osman. editor. Moneim Elhadi Sulieman, Abdel. editor. SpringerLink (Online service)
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Cover image for Advances in Integrated Design and Production II Proceedings of the 12th International Conference on Integrated Design and Production, CPI 2022, May 10-12, 2022, ENSAM, Rabat, Morocco
Advances in Integrated Design and Production II Proceedings of the 12th International Conference on Integrated Design and Production, CPI 2022, May 10-12, 2022, ENSAM, Rabat, Morocco
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Azrar, Lahcen. editor. Jalid, Abdelilah. editor. Lamouri, Samir. editor. Siadat, Ali. editor. Taha Janan, Mourad. editor.
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Clinical and Laboratory Medicine Textbook
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Cover image for Proceedings of the International Conference on Information Control, Electrical Engineering and Rail Transit ICEERT 2022
Proceedings of the International Conference on Information Control, Electrical Engineering and Rail Transit ICEERT 2022
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Yadav, Sanjay. editor. Kumar, Rahul. editor. Zainuddin, Hidayat. editor. Deng, Lvxiang. editor. SpringerLink (Online service)
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Cover image for Thermoelectric micro/nano generators. Volume 1, Fundamental physics, materials and measurements
Thermoelectric micro/nano generators. Volume 1, Fundamental physics, materials and measurements
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Akinaga, Hiroyuki, editor. Kosuga, Atsuko, editor. Mori, Takao, editor. Ardila, Gustavo, editor.
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Cover image for Photonic quantum technologies : science and applications
Photonic quantum technologies : science and applications
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Benyoucef, Mohamed, editor.
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Cover image for Industry 4.1 : intelligent manufacturing with zero defects
Industry 4.1 : intelligent manufacturing with zero defects
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Cheng, Fan-Tien, editor.
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Cover image for Analytical chemistry : an introduction to pharmaceutical GMP laboratory
Analytical chemistry : an introduction to pharmaceutical GMP laboratory
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Cover image for Inkjet printing in industry : materials, technologies, systems, and applications
Inkjet printing in industry : materials, technologies, systems, and applications
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Zapka, Werner, editor.
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Cover image for Fundamentals of terahertz devices and applications
Fundamentals of terahertz devices and applications
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Cover image for Photovoltaic manufacturing : etching, texturing, and cleaning
Photovoltaic manufacturing : etching, texturing, and cleaning
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Müller, Monika Freunek.
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Forward and inverse scattering algorithms based on contrast source integral equations
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Berg, P. M. van den, author.
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Cover image for Quantum information : from foundations to quantum technology applications
Quantum information : from foundations to quantum technology applications
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Bruss, Dagmar, editor. Leuchs, Gerd, editor.
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Cover image for Handbook of industrial inkjet printing. Volume 1 & 2 : a full system approach
Handbook of industrial inkjet printing. Volume 1 & 2 : a full system approach
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Zapka, Werner, editor.
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Cover image for Mechanical vibrations : applications to equipment
Mechanical vibrations : applications to equipment
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Mori, Yvon, author.
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Micro- and nanophotonic technologies
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Meyrueis, Patrick, editor. Sakoda, Kazuaki, 1957- editor. Voorde, M. H. van de (Marcel H.), editor.
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Cover image for Static electricity : understanding, controlling, applying
Static electricity : understanding, controlling, applying
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Lüttgens, Günter, author. Lüttgens, Sylvia, author. Schubert, Wolfgang, author.
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Cover image for Recent Global Research and Education: Technological Challenges Proceedings of the 15th International Conference on Global Research and Education Inter-Academia 2016
Recent Global Research and Education: Technological Challenges Proceedings of the 15th International Conference on Global Research and Education Inter-Academia 2016
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Jabłoński, Ryszard. editor. Szewczyk, Roman. editor. SpringerLink (Online service)
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Cover image for Recent Advances in Systems, Control and Information Technology Proceedings of the International Conference SCIT 2016, May 20-21, 2016, Warsaw, Poland
Recent Advances in Systems, Control and Information Technology Proceedings of the International Conference SCIT 2016, May 20-21, 2016, Warsaw, Poland
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Szewczyk, Roman. editor. Kaliczyńska, Małgorzata. editor. (orcid)0000-0003-3886-5504 SpringerLink (Online service)
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Cover image for Micro-Manufacturing Technologies and Their Applications A Theoretical and Practical Guide
Micro-Manufacturing Technologies and Their Applications A Theoretical and Practical Guide
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Fassi, Irene. editor. Shipley, David. editor. SpringerLink (Online service)
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EuroKarst 2016, Neuchâtel Advances in the Hydrogeology of Karst and Carbonate Reservoirs
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Renard, Philippe. editor. Bertrand, Catherine. editor. SpringerLink (Online service)
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Agache's Measuring the Skin Non-invasive Investigations, Physiology, Normal Constants
Author 
Humbert, Philippe. editor. Fanian, Ferial. editor. Maibach, Howard I. editor. (orcid)0000-0003-0430-475X Agache, Pierre. editor. SpringerLink (Online service)
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Cover image for Handbook of Visual Display Technology
Handbook of Visual Display Technology
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Air Flow Management in Raised Floor Data Centers
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Arghode, Vaibhav K. author. Joshi, Yogendra. author. SpringerLink (Online service)
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Cover image for Analysis of Machining and Machine Tools
Analysis of Machining and Machine Tools
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Liang, Steven. author. Shih, Albert J. author. SpringerLink (Online service)
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Advanced Mechatronics Solutions
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Jabłoński, Ryszard. editor. Brezina, Tomas. editor. SpringerLink (Online service)
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Cover image for Digital Holography and Wavefront Sensing Principles, Techniques and Applications
Digital Holography and Wavefront Sensing Principles, Techniques and Applications
Author 
Schnars, Ulf. author. Falldorf, Claas. author. Watson, John. author. Jüptner, Werner. author. SpringerLink (Online service)
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Cover image for Pattern Recognition and Image Analysis 7th Iberian Conference, IbPRIA 2015, Santiago de Compostela, Spain, June 17-19, 2015, Proceedings
Pattern Recognition and Image Analysis 7th Iberian Conference, IbPRIA 2015, Santiago de Compostela, Spain, June 17-19, 2015, Proceedings
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Paredes, Roberto. editor. Cardoso, Jaime S. editor. Pardo, Xosé M. editor. SpringerLink (Online service)
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Pattern Recognition and Machine Intelligence 6th International Conference, PReMI 2015, Warsaw, Poland, June 30 - July 3, 2015, Proceedings
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Kryszkiewicz, Marzena. editor. Bandyopadhyay, Sanghamitra. editor. Rybinski, Henryk. editor. Pal, Sankar K. editor. SpringerLink (Online service)
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119. 
Cover image for Microstructuring of Thermo-Mechanically Highly Stressed Surfaces Final Report of the DFG Research Group 576
Microstructuring of Thermo-Mechanically Highly Stressed Surfaces Final Report of the DFG Research Group 576
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Denkena, Berend. editor. Rienäcker, Adrian. editor. Knoll, Gunter. editor. Bach, Friedrich-Wilhelm. editor. Maier, Hans Jürgen. editor.
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Integrated Imaging and Vision Techniques for Industrial Inspection Advances and Applications
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Liu, Zheng. editor. Ukida, Hiroyuki. editor. Ramuhalli, Pradeep. editor. Niel, Kurt. editor. SpringerLink (Online service)
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Cover image for Large and middle-scale aperture aspheric surfaces : lapping, polishing and measurement
Large and middle-scale aperture aspheric surfaces : lapping, polishing and measurement
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Li, Shengyi. Dai, Yifan.
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TS517.5 .A86
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122. 
Cover image for Drills : science and technology of advanced operations
Drills : science and technology of advanced operations
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Astakhov, Viktor P., author.
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TJ1260 .A87 2014
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Applications of EPR in Radiation Research
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Lund, Anders. editor. Shiotani, Masaru. editor. SpringerLink (Online service)
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Cover image for Optical devices in ophthalmology and optometry technology, design principles and clinical applications
Optical devices in ophthalmology and optometry technology, design principles and clinical applications
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Donnerhacke, Karl-Heinz. Rill, Michael Stefan. Kaschke, Michael F.
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Cover image for Electrical impedance : principles, measurement, and applications
Electrical impedance : principles, measurement, and applications
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Callegaro, Luca., author.
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QC522 .C35 2013
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Yasal metroloji
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127. 
Cover image for Luminescence : the instrumental key to the future of nanotechnology
Luminescence : the instrumental key to the future of nanotechnology
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Gilmore, Adam M., editor.
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QC476.5 .L86 2013
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Cover image for Measurements with persons theory, methods, and implementation areas
Measurements with persons theory, methods, and implementation areas
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Berglund, Birgitta.
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Coordinate measuring machines and systems
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Hocken, Robert J. Pereira, Paulo H.
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TA165.5 .C66 2012
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130. 
Cover image for Fundamentals of laser micromachining
Fundamentals of laser micromachining
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Schaeffer, Ronald D., author.
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TA1675 .S33 2012
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100 years of superconductivity
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Rogalla, H. (Horst) Kes, P. H. (Peter H.)
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Cover image for Computer network time synchronization : the Network Time Protocol on Earth and in space
Computer network time synchronization : the Network Time Protocol on Earth and in space
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Mills, David L., author.
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TK5105.575 .M55 2011
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Cover image for Fundamental principles of engineering nanometrology
Fundamental principles of engineering nanometrology
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Leach, R. K.
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Cover image for Handbook of photonics for biomedical science
Handbook of photonics for biomedical science
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Tuchin, V. V. (Valerii Viktorovich)
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R857 .O6 H366 2010
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Cover image for Fundamental principles of engineering nanometrology
Fundamental principles of engineering nanometrology
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Leach, R. K.
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136. 
Cover image for Microcomputed tomography : methodology and applications
Microcomputed tomography : methodology and applications
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Stock, Stuart R., author.
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RC78.7 .T6 S73 2009
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137. 
Cover image for Handbook of semiconductor manufacturing technology
Handbook of semiconductor manufacturing technology
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Doering, Robert, 1946- Nishi, Yoshio, 1940-
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TK7871.85 .H3335 2008
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Cover image for Financial justification of nondestructive testing : cost of quality in manufacturing
Financial justification of nondestructive testing : cost of quality in manufacturing
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Papadakis, Emmanuel P., author.
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TA417.2 .P37 2007
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Cover image for Solid-state lasers and applications
Solid-state lasers and applications
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Sennaroglu, Alphan.
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TA1705 .S6748 2007
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Cover image for Microlithography : science and technology
Microlithography : science and technology
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Suzuki, Kazuaki. Smith, Bruce W., 1959-
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Cover image for Optical inspection of microsystems
Optical inspection of microsystems
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Osten, Wolfgang.
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TS156.2 .O652 2007
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Cover image for Computer network time synchronization : the network time protocol
Computer network time synchronization : the network time protocol
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Mills, David L., author.
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TK5105.5 .M564 2006
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Cover image for Handbook of photomask manufacturing technology
Handbook of photomask manufacturing technology
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Rizvi, Syed.
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TK7872 .M3 H36 2005
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Cover image for Handbook of Laser Technology and Applications (Three- Volume Set).
Handbook of Laser Technology and Applications (Three- Volume Set).
Author 
Taylor and Francis.
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TA1675 .H363 2003
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145. 
Cover image for Evaluating the measurement uncertainty : fundamentals and practical guidance
Evaluating the measurement uncertainty : fundamentals and practical guidance
Author 
Lira, Ignacio, 1951- author.
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T50
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Taylor & Francis https://www.taylorfrancis.com/books/9780367801564
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146. 
Cover image for Practical density measurement and hydrometry
Practical density measurement and hydrometry
Author 
Gupta, S. V., author.
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QD169 .W3
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Cover image for Handbook of mass measurement
Handbook of mass measurement
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Jones, Frank E., author. Schoonover, Randall M.
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QC106 .J66 2002
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Cover image for Handbook of optical engineering
Handbook of optical engineering
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Malacara, Daniel, 1937- Thompson, Brian J.
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TA1520 .H368 2001
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Cover image for Assessment of Oral Health : Diagnostic Techniques and Validation Criteria
Assessment of Oral Health : Diagnostic Techniques and Validation Criteria
Author 
Faller, R.V., editor.
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XX(548684.1)
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