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1. 
Cover image for Instrumentation measurement and analysis
Instrumentation measurement and analysis
Author 
Nakra, B. C. Chaudhry, K. K.
Preferred Shelf Number 
TA165 N34 2011
Format: 
Availability 
Beytepe Library~1
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2. 
Cover image for Nanoscale calibration standards and methods dimensional and related measurements in the micro- and nanometer range
Nanoscale calibration standards and methods dimensional and related measurements in the micro- and nanometer range
Author 
Wilkening, Günter. Koenders, Ludger. Wiley InterScience (Online service)
Preferred Shelf Number 
ONLINE
Electronic Access 
Contributor biographical information http://catdir.loc.gov/catdir/enhancements/fy0653/2006482032-b.html
John Wiley http://dx.doi.org/10.1002/3527606661
Ebook Library http://public.eblib.com/EBLPublic/PublicView.do?ptiID=481681
MyiLibrary, Table of contents http://www.myilibrary.com?id=85401&ref=toc
http://swb.eblib.com/patron/FullRecord.aspx?p=481681
Format: 
Availability 
Online Library~1
Available:
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