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1. 
Cover image for Lattice defects in semiconductors
Lattice defects in semiconductors
Author 
International Symposium on Lattice Defects in Semiconductors (1966 : Tokyo). Hasiguti, Ryukiti R., ed.
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QC 612.S4 I59 1966
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2. 
Cover image for Gettering Defects in Semiconductors
Gettering Defects in Semiconductors
Author 
Perevoschikov, Victor A. author. Skoupov, Vladimir D. author. SpringerLink (Online service)
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http://dx.doi.org/10.1007/3-540-29499-6
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3. 
Cover image for Light-induced defects in semiconductors
Light-induced defects in semiconductors
Author 
Morigaki, Kazuo, author. Hikita, Harumi, author. Ogihara, Chisato, 1951- author.
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ONLINE(342751.1)
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4. 
Cover image for Theory of Defects in Semiconductors
Theory of Defects in Semiconductors
Author 
Drabold, David A. editor. Estreicher, Stefan K. editor. SpringerLink (Online service)
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http://dx.doi.org/10.1007/11690320
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5. 
Cover image for Defects-recognition imaging and physics in semiconductors XIV selected peer reviewed papers from the 14th international conference on defects-recognition, imaging and physics in semiconductors, September 25-29, 2011, Miyazaki, Japan
Defects-recognition imaging and physics in semiconductors XIV selected peer reviewed papers from the 14th international conference on defects-recognition, imaging and physics in semiconductors, September 25-29, 2011, Miyazaki, Japan
Author 
International Conference on Defects: Recognition, Imaging and Physics in Semiconductors (2011 : Miyazaki, Japan) Yamada-Kaneta, Hiroshi. Sakai, Akira.
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ONLINE
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EBSCOhost http://search.ebscohost.com/login.aspx?direct=true&scope=site&db=nlebk&db=nlabk&AN=517215
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6. 
Cover image for CdTe and related compounds physics, defects, technology, hetero- and nanostructures and applications : physics, CdTe-based nanostructures, and semimagnetic semiconductors, defects
CdTe and related compounds physics, defects, technology, hetero- and nanostructures and applications : physics, CdTe-based nanostructures, and semimagnetic semiconductors, defects
Author 
Triboulet, R. Siffert, P. (Paul)
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ScienceDirect http://www.sciencedirect.com/science/book/9780080464091
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7. 
Cover image for Extended Defects in Semiconductors Electronic Properties, Device Effects and Structures
Extended Defects in Semiconductors Electronic Properties, Device Effects and Structures
Author 
Holt, D. B.. Yacobi, B. G..
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8. 
Cover image for III-nitride semiconductors electrical, structural, and defects properties
III-nitride semiconductors electrical, structural, and defects properties
Author 
Manasreh, Mahmoud Omar.
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ScienceDirect http://www.sciencedirect.com/science/book/9780444506306
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9. 
Cover image for Handbook of luminescent semiconductor materials
Handbook of luminescent semiconductor materials
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Bergman, Leah. McHale, Jeanne L.
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10. 
Cover image for Trap level spectroscopy in amorphous semiconductors
Trap level spectroscopy in amorphous semiconductors
Author 
Mikla, Victor I.
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ScienceDirect http://www.sciencedirect.com/science/book/9780123847157
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11. 
Cover image for Defects and diffusion, theory and simulation an annual retrospective II
Defects and diffusion, theory and simulation an annual retrospective II
Author 
Fisher, D. J., editor of compilation.
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EBSCOhost http://search.ebscohost.com/login.aspx?direct=true&scope=site&db=nlebk&db=nlabk&AN=503469
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12. 
Cover image for Transient-induced latchup in CMOS integrated circuits
Transient-induced latchup in CMOS integrated circuits
Author 
Ker, Ming-Dou. Hsu, Sheng-Fu.
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IEEE Xplore http://ieeexplore.ieee.org/xpl/bkabstractplus.jsp?bkn=5453758
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13. 
Cover image for Handbook of semiconductor technology
Handbook of semiconductor technology
Author 
Jackson, Kenneth A. Schröter, W. (Wolfgang)
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Wiley InterScience An electronic book accessible through the World Wide Web; click for information
Wiley InterScience An electronic book accessible through the World Wide Web; click for information
Knovel http://app.knovel.com/web/toc.v/cid:kpHSTV0003
John Wiley http://dx.doi.org/10.1002/9783527619290
HathiTrust Digital Library Limited view (search only) http://catalog.hathitrust.org/api/volumes/oclc/43030635.html
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14. 
Cover image for Selected Topics in Group IV and II-VI Semiconductors Proceedings of Symposium L and Symposium D of the 1995 E-Mrs Spring Conference, Strasbourg, France, 22-26 May 1995
Selected Topics in Group IV and II-VI Semiconductors Proceedings of Symposium L and Symposium D of the 1995 E-Mrs Spring Conference, Strasbourg, France, 22-26 May 1995
Author 
International Symposium on Silicon Molecular Beam Epitaxy (6th : 1995 : Strasbourg, France) Kasper, E.
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ScienceDirect http://www.sciencedirect.com/science/book/9780444824110
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15. 
Cover image for C, H, N and O in Si and Characterization and Simulation of Materials and Processes Proceedings of Symposium N and Symposium G of the 1995 E-Mrs Spring Conference, Held in Strasbourg, France, 22-26 May 1995
C, H, N and O in Si and Characterization and Simulation of Materials and Processes Proceedings of Symposium N and Symposium G of the 1995 E-Mrs Spring Conference, Held in Strasbourg, France, 22-26 May 1995
Author 
Symposium N on Carbon, Hydrogen, Nitrogen, and Oxygen in Silicon and Other Elemental Semiconductors (1995 : Strasbourg, France) Borghesi, A. Symposium G on Atomic Scale Characterization and Simulation of Materials and Processes (1995 : Strasbourg, France)
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ScienceDirect http://www.sciencedirect.com/science/book/9780444824134
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16. 
Cover image for Hydrogen in semiconductors bulk and surface properties : proceedings of the Sixth Trieste IUPAP-ICTP Semiconductor Symposium, International Centre for Theoretical Physics, Trieste, Italy, 27-31 August 1990
Hydrogen in semiconductors bulk and surface properties : proceedings of the Sixth Trieste IUPAP-ICTP Semiconductor Symposium, International Centre for Theoretical Physics, Trieste, Italy, 27-31 August 1990
Author 
Trieste ICTP-IUPAP Semiconductor Symposium (6th : 1990) Stutzmann, M. (Martin) Chevallier, J. (Jacques)
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ScienceDirect http://www.sciencedirect.com/science/book/9780444891389
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17. 
Cover image for Defect control in semiconductors proceedings of the International Conference on the Science and Technology of Defect Control in Semiconductors, the Yokohama 21st century forum, Yokohama, Japan, September 17-22 1989. Vol. 2
Defect control in semiconductors proceedings of the International Conference on the Science and Technology of Defect Control in Semiconductors, the Yokohama 21st century forum, Yokohama, Japan, September 17-22 1989. Vol. 2
Author 
International Conference on the Science and Technology of Defect Control in Semiconductors (1989 : Yokohama-shi, Japan) Sumino, K. (Kōji), 1931-
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ScienceDirect http://www.sciencedirect.com/science/book/9780444884299
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