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1. 
Cover image for ESD protection methodologies : from component to system
ESD protection methodologies : from component to system
Author 
Bafleur, Marise, author. Caignet, Fabrice, author. Nolhier, Nicolas, author.
Preferred Shelf Number 
ONLINE
Electronic Access 
ScienceDirect https://www.sciencedirect.com/science/book/9781785481222
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2. 
Cover image for The Lightning Flash
The Lightning Flash
Author 
Cooray, Vernon, ed.
Preferred Shelf Number 
\(364917.1)
Electronic Access 
http://dx.doi.org/10.1049/PBPO069E
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3. 
Cover image for Fractional kinetics in solids anomalous charge transport in semiconductors, dielectrics, and nanosystems
Fractional kinetics in solids anomalous charge transport in semiconductors, dielectrics, and nanosystems
Author 
Uchaĭkin, V. V. (Vladimir Vasilʹevich) Sibatov, Renat.
Preferred Shelf Number 
ONLINE
Electronic Access 
EBSCOhost http://search.ebscohost.com/login.aspx?direct=true&scope=site&db=nlebk&db=nlabk&AN=516997
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4. 
Cover image for ESD basics from semiconductor manufacturing to use
ESD basics from semiconductor manufacturing to use
Author 
Voldman, Steven H. Wiley InterScience (Online service)
Preferred Shelf Number 
ONLINE
Electronic Access 
Wiley InterScience An electronic book accessible through the World Wide Web; click for information
Connect to MyiLibrary resource.
ebrary http://site.ebrary.com/id/10602092
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5. 
Cover image for Enhancing extraction processes in the food industry
Enhancing extraction processes in the food industry
Author 
Lebovka, N. I. (Nikola? Ivanovich) Vorobiev, Eugn̈e. Chm̌at, Farid.
Preferred Shelf Number 
ONLINE
Electronic Access 
Distributed by publisher. Purchase or institutional license may be required for access.
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6. 
Cover image for Gaseous electronics tables, atoms, and molecules
Gaseous electronics tables, atoms, and molecules
Author 
Raju, Gorur G., 1937-
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ONLINE
Electronic Access 
Distributed by publisher. Purchase or institutional license may be required for access.
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7. 
Cover image for Guide to mitigating spacecraft charging effects
Guide to mitigating spacecraft charging effects
Author 
Garrett, Henry B. author. Wiley InterScience (Online service)
Preferred Shelf Number 
ONLINE
Electronic Access 
Wiley InterScience An electronic book accessible through the World Wide Web; click for information
ebrary http://site.ebrary.com/id/10630527
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8. 
Cover image for Electrostatic discharge understand, simulate and fix ESD problems
Electrostatic discharge understand, simulate and fix ESD problems
Author 
Mardiguian, Michel.
Preferred Shelf Number 
ONLINE
Electronic Access 
IEEE Xplore http://ieeexplore.ieee.org/xpl/bkabstractplus.jsp?bkn=5361037
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9. 
Cover image for ESD failure mechanisms and models
ESD failure mechanisms and models
Author 
Voldman, Steven H. Wiley InterScience (Online service)
Preferred Shelf Number 
ONLINE
Electronic Access 
John Wiley http://dx.doi.org/10.1002/9780470747254
http://site.ebrary.com/lib/alltitles/Doc?id=10317806
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10. 
Cover image for Micromachining using electrochemical discharge phenomenon fundamentals and applications of spark assisted chemical engraving
Micromachining using electrochemical discharge phenomenon fundamentals and applications of spark assisted chemical engraving
Author 
Wüthrich, Rolf.
Preferred Shelf Number 
ONLINE
Electronic Access 
ScienceDirect http://www.sciencedirect.com/science/book/9780815515876
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11. 
Cover image for Contamination and ESD control in high technology manufacturing
Contamination and ESD control in high technology manufacturing
Author 
Welker, R. W. Nagarajan, R. (Ramamurthy) Newberg, Carl E. John Wiley & Sons.
Preferred Shelf Number 
ONLINE
Electronic Access 
IEEE Xplore http://ieeexplore.ieee.org/xpl/bkabstractplus.jsp?bkn=5201423
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12. 
Cover image for ESD RF technology and circuits
ESD RF technology and circuits
Author 
Voldman, Steven H. Wiley InterScience (Online service)
Preferred Shelf Number 
ONLINE
Electronic Access 
Volltext http://www3.interscience.wiley.com/cgi-bin/bookhome/113386521
http://www3.interscience.wiley.com/cgi-bin/bookhome/113386521/ProductInformation.html
John Wiley http://dx.doi.org/10.1002/0470061405
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