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1. 
Cover image for Embedded software system testing : automatic testing solution based on formal method
Embedded software system testing : automatic testing solution based on formal method
Author 
Yin, Yongfeng, 1978- author. Jiang, Bo, 1981- author. Su, Qingran, translator. Qiu, Ruinan, translator. Guo, Yang (Translator), translator.
Preferred Shelf Number 
TK7895 .E42
Electronic Access 
Taylor & Francis https://www.taylorfrancis.com/books/9781003390923
OCLC metadata license agreement http://www.oclc.org/content/dam/oclc/forms/terms/vbrl-201703.pdf
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2. 
Cover image for The Electrical Engineering Handbook - Six Volume Set
The Electrical Engineering Handbook - Six Volume Set
Author 
Dorf, Richard C., editor. Taylor and Francis.
Preferred Shelf Number 
R857 .B54
Electronic Access 
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3. 
Cover image for Testing Complex and Embedded Systems
Testing Complex and Embedded Systems
Author 
Pries, Kim H., author. Quigley, Jon M., author. Taylor and Francis.
Preferred Shelf Number 
TK7895 .E42
Electronic Access 
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4. 
Cover image for Intelligent Software Methodologies, Tools and Techniques 14th International Conference, SoMet 2015, Naples, Italy, September 15-17, 2015. Proceedings
Intelligent Software Methodologies, Tools and Techniques 14th International Conference, SoMet 2015, Naples, Italy, September 15-17, 2015. Proceedings
Author 
Fujita, Hamido. editor. (orcid) Guizzi, Guido. editor. SpringerLink (Online service)
Preferred Shelf Number 
ONLINE
Electronic Access 
https://doi.org/10.1007/978-3-319-22689-7
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5. 
Cover image for Model-based testing for embedded systems
Model-based testing for embedded systems
Author 
Zander, Justyna. Schieferdecker, Ina. Mosterman, Pieter J.
Preferred Shelf Number 
TK7895 .E42 M636 2011
Electronic Access 
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6. 
Cover image for Digital design and fabrication
Digital design and fabrication
Author 
Oklobdzija, Vojin G.
Preferred Shelf Number 
TK7885 .D54 2008
Electronic Access 
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