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Cover image for Moderne Röntgenbeugung Röntgendiffraktometrie für Materialwissenschaftler, Physiker und Chemiker
Moderne Röntgenbeugung Röntgendiffraktometrie für Materialwissenschaftler, Physiker und Chemiker
Author 
Spieß, Lothar. author. Teichert, Gerd. author. Schwarzer, Robert. author. Behnken, Herfried. author. Genzel, Christoph. author.
Preferred Shelf Number 
ONLINE
Electronic Access 
http://dx.doi.org/10.1007/978-3-8349-9434-9
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Online Library~1
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2. 
Cover image for Thin film analysis by X-ray scattering
Thin film analysis by X-ray scattering
Author 
Birkholz, Mario. Fewster, Paul F. Genzel, Christoph. John Wiley & Sons.
Preferred Shelf Number 
ONLINE
Electronic Access 
John Wiley http://dx.doi.org/10.1002/3527607595
http://www3.interscience.wiley.com/cgi-bin/bookhome/112599282
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Online Library~1
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