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Cover image for Terrestrial radiation effects in ULSI devices and electronic systems
Terrestrial radiation effects in ULSI devices and electronic systems
Author 
Ibe, Eishi H., author.
Preferred Shelf Number 
ONLINE(342252.1)
Electronic Access 
John Wiley http://dx.doi.org/10.1002/9781118479308
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Online Library~1
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2. 
Cover image for Dependability in Electronic Systems Mitigation of Hardware Failures, Soft Errors, and Electro-Magnetic Disturbances
Dependability in Electronic Systems Mitigation of Hardware Failures, Soft Errors, and Electro-Magnetic Disturbances
Author 
Kanekawa, Nobuyasu. author. Ibe, Eishi H. author. Suga, Takashi. author. Uematsu, Yutaka. author. SpringerLink (Online service)
Preferred Shelf Number 
ONLINE
Electronic Access 
http://dx.doi.org/10.1007/978-1-4419-6715-2
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Availability 
Online Library~1
Available:
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