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1. 
Cover image for Testing for small-delay defects in nanoscale CMOS integrated circuits
Testing for small-delay defects in nanoscale CMOS integrated circuits
Author 
Goel, Sandeep K, editor of compilation. Chakrabarty, Krishnendu, editor of compilation.
Preferred Shelf Number 
TK7871.99 .M44 T43 2014
Electronic Access 
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2. 
Cover image for Counterfeit Integrated Circuits Detection and Avoidance
Counterfeit Integrated Circuits Detection and Avoidance
Author 
Tehranipoor, Mark (Mohammad). author. Guin, Ujjwal. author. Forte, Domenic. author. SpringerLink (Online service)
Preferred Shelf Number 
ONLINE
Electronic Access 
https://doi.org/10.1007/978-3-319-11824-6
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3. 
Cover image for Defects in microelectronic materials and devices
Defects in microelectronic materials and devices
Author 
Fleetwood, D. M. (Dan M.) Pantelides, Sokrates T. Schrimpf, Ronald Donald.
Preferred Shelf Number 
TK7871 .D44 2009
Electronic Access 
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4. 
Cover image for High-speed VLSI interconnections
High-speed VLSI interconnections
Author 
Goel, Ashok K., 1953-
Preferred Shelf Number 
ONLINE
Electronic Access 
IEEE Xplore http://ieeexplore.ieee.org/xpl/bkabstractplus.jsp?bkn=5201516
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