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Cover image for System-on-chip test architectures nanometer design for testability
System-on-chip test architectures nanometer design for testability
Author 
Wang, Laung-Terng. Stroud, Charles E. Touba, Nur A.
Preferred Shelf Number 
ONLINE
Electronic Access 
ScienceDirect http://www.sciencedirect.com/science/book/9780123739735
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2. 
Cover image for VLSI test principles and architectures design for testability
VLSI test principles and architectures design for testability
Author 
Wang, Laung-Terng. Wu, Cheng-Wen, EE Ph. D. Wen, Xiaoqing.
Preferred Shelf Number 
ONLINE
Electronic Access 
ScienceDirect http://www.sciencedirect.com/science/book/9780123705976
Format: 
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3. 
Cover image for Essentials of electronic testing for digital, memory, and mixed-signal VLSI circuits
Essentials of electronic testing for digital, memory, and mixed-signal VLSI circuits
Author 
Bushnell, Michael L. (Michael Lee), 1950- Agrawal, Vishwani D., 1943-
Preferred Shelf Number 
TK7874.75 B87 2000
Format: 
Availability 
Beytepe Library~1
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