Title:
Design and analysis of accelerated tests for mission critical reliability
Author:
LuValle, Michael J.
ISBN:
9780203492031
Publication Information:
Boca Raton : Chapman & Hall/CRC, 2004.
Physical Description:
236 p. : ill.
Holds:
Copies:
Available:*
Library | Material Type | Item Barcode | Shelf Number | Status | Item Holds |
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Searching... | E-Book | 288235-1001 | ONLINE | Searching... | Searching... |