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Cover image for System reliability analysis : transition from binary to multi-state models
System reliability analysis : transition from binary to multi-state models
Author 
Kumar, Akshay, editor. Ram, Mangey, editor. Gaonkar, Rajesh S. Prabhu, editor. Klochkov, Yury, editor.
Preferred Shelf Number 
TA169
Electronic Access 
Taylor & Francis https://www.taylorfrancis.com/books/9781003546214
OCLC metadata license agreement http://www.oclc.org/content/dam/oclc/forms/terms/vbrl-201703.pdf
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2. 
Cover image for Predictive Analytics in System Reliability
Predictive Analytics in System Reliability
Author 
Kumar, Vijay. editor. Pham, Hoang. editor. SpringerLink (Online service)
Preferred Shelf Number 
ONLINE
Electronic Access 
https://doi.org/10.1007/978-3-031-05347-4
Format: 
Availability 
Online Library~1
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