Limit Search Results
Author
SpringerLink (Online service)
(10)
Wiley InterScience (Online service)
(5)
Amelinckx, S. (Severin)
(4)
Cullis, A. G. editor.
(2)
Fultz, Brent. author.
(2)
Language
Publication Date
-
Subject
Material Type
Shelf Location
Library
Switch to list view
Switch to thumbnail view
Select an Action
29 Results Found Subscribe to search results
000000000000DEFAULT
Print
1. 
Cover image for Microscopy of Semiconducting Materials 2007
Microscopy of Semiconducting Materials 2007
Author 
Cullis, A. G. editor. Midgley, P. A. editor. SpringerLink (Online service)
Preferred Shelf Number 
ONLINE
Electronic Access 
http://dx.doi.org/10.1007/978-1-4020-8615-1
Format: 
Availability 
Online Library~1
Available:
Copies:
2. 
Cover image for Transmission Electron Microscopy and Diffractometry of Materials
Transmission Electron Microscopy and Diffractometry of Materials
Author 
Fultz, Brent. author. Howe, James. author. SpringerLink (Online service)
Preferred Shelf Number 
ONLINE(333265.1)
Electronic Access 
http://dx.doi.org/10.1007/978-3-642-29761-8
Format: 
Availability 
Online Library~1
Available:
Copies:
3. 
Cover image for Transmission Electron Microscopy and Diffractometry of Materials
Transmission Electron Microscopy and Diffractometry of Materials
Author 
Fultz, Brent. author. Howe, James M. author. SpringerLink (Online service)
Preferred Shelf Number 
ONLINE
Electronic Access 
http://dx.doi.org/10.1007/978-3-540-73886-2
Format: 
Availability 
Online Library~1
Available:
Copies:
4. 
Cover image for Electron microscopy and structure of materials : proceedings
Electron microscopy and structure of materials : proceedings
Author 
International Materials Symposium (5th : 1971 : University of California, Berkeley) Thomas, Gareth. , ed. Fulrath, Richard M. , ed. Fisher, Robert M., ed. University Conference on Ceramic Science (7th : 1971 : Berkeley)
Preferred Shelf Number 
TA 407 I65 1972
Format: 
Availability 
Beytepe Library~1
Available:
Copies:
5. 
Cover image for Scanning Probe Microscopy of Functional Materials Nanoscale Imaging and Spectroscopy
Scanning Probe Microscopy of Functional Materials Nanoscale Imaging and Spectroscopy
Author 
Kalinin, Sergei V. editor. Gruverman, Alexei. editor. SpringerLink (Online service)
Preferred Shelf Number 
ONLINE
Electronic Access 
http://dx.doi.org/10.1007/978-1-4419-7167-8
Format: 
Availability 
Online Library~1
Available:
Copies:
6. 
Cover image for Transmission Electron Microscopy A Textbook for Materials Science
Transmission Electron Microscopy A Textbook for Materials Science
Author 
Williams, David B. author. Carter, C. Barry. author. SpringerLink (Online service)
Preferred Shelf Number 
ONLINE
Electronic Access 
http://dx.doi.org/10.1007/978-0-387-76501-3
Format: 
Availability 
Online Library~1
Available:
Copies:
7. 
Cover image for EMC 2008 14th European Microscopy Congress 1–5 September 2008, Aachen, Germany Volume 2: Materials Science
EMC 2008 14th European Microscopy Congress 1–5 September 2008, Aachen, Germany Volume 2: Materials Science
Author 
Richter, Silvia. editor. Schwedt, Alexander. editor. SpringerLink (Online service)
Preferred Shelf Number 
ONLINE
Electronic Access 
http://dx.doi.org/10.1007/978-3-540-85226-1
Format: 
Availability 
Online Library~1
Available:
Copies:
8. 
Cover image for Microscopy of Semiconducting Materials Proceedings of the 14th Conference, April 11–14, 2005, Oxford, UK
Microscopy of Semiconducting Materials Proceedings of the 14th Conference, April 11–14, 2005, Oxford, UK
Author 
Cullis, A. G. editor. Hutchison, J. L. editor. SpringerLink (Online service)
Preferred Shelf Number 
ONLINE
Electronic Access 
http://dx.doi.org/10.1007/3-540-31915-8
Format: 
Availability 
Online Library~1
Available:
Copies:
9. 
Cover image for Scanning Probe Microscopy: Characterization, Nanofabrication and Device Application of Functional Materials Proceedings of the NATO Advanced Study Institute on Scanning Probe Microscopy: Characterization, Nanofabrication and Device Application of Functional Materials Algarve, Portugal 1–13 October 2002
Scanning Probe Microscopy: Characterization, Nanofabrication and Device Application of Functional Materials Proceedings of the NATO Advanced Study Institute on Scanning Probe Microscopy: Characterization, Nanofabrication and Device Application of Functional Materials Algarve, Portugal 1–13 October 2002
Author 
Vilarinho, Paula Maria. editor. Rosenwaks, Yossi. editor. Kingon, Angus. editor. SpringerLink (Online service)
Preferred Shelf Number 
ONLINE
Electronic Access 
http://dx.doi.org/10.1007/1-4020-3019-3
Format: 
Availability 
Online Library~1
Available:
Copies:
10. 
Cover image for Characterization of High Tc Materials and Devices by Electron Microscopy
Characterization of High Tc Materials and Devices by Electron Microscopy
Author 
Browning, Nigel D.. Pennycook, Stephen J..
Preferred Shelf Number 
ONLINE
Electronic Access 
Access by subscription
Format: 
Availability 
Online Library~1
Available:
Copies:
11. 
Cover image for Handbook of microscopy applications in materials science, solid-state physics, and chemistry
Handbook of microscopy applications in materials science, solid-state physics, and chemistry
Author 
Amelinckx, S. (Severin) Wiley InterScience (Online service)
Preferred Shelf Number 
ONLINE
Electronic Access 
John Wiley http://dx.doi.org/10.1002/9783527619283
Format: 
Availability 
Online Library~1
Available:
Copies:
12. 
Cover image for Handbook of microscopy applications in materials science, solid-state physics and chemistry. Methods I
Handbook of microscopy applications in materials science, solid-state physics and chemistry. Methods I
Author 
Amelinckx, S. (Severin) Wiley InterScience (Online service)
Preferred Shelf Number 
ONLINE
Electronic Access 
Wiley InterScience An electronic book accessible through the World Wide Web; click for information
Format: 
Availability 
Online Library~1
Available:
Copies: