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1. 
Cover image for Nuclear and electron resonance spectroscopies applied to materials science : proceedings of the Materials Research Society Meeting. Nov. 1980, Copley Plaza Hotel, Boston, Mass.
Nuclear and electron resonance spectroscopies applied to materials science : proceedings of the Materials Research Society Meeting. Nov. 1980, Copley Plaza Hotel, Boston, Mass.
Author 
Kaufmann, E. N., ed. Shenoy, G. K., ed.
Preferred Shelf Number 
QC 762 N85 1981
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2. 
Cover image for Scientific basis for nuclear waste management : proceedings of the ...November 1981, Boston,Mass
Scientific basis for nuclear waste management : proceedings of the ...November 1981, Boston,Mass
Author 
Materials Research Society Annual Meeting (1881: Boston, Mass.)
Preferred Shelf Number 
TD 898 M375 1981
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3. 
Cover image for Amorphous and heterogeneous silicon thin films : Fundamentals to devices, 1999 : Symposium held April 5-9, 1999, San Francisco, California, U.S.A.
Amorphous and heterogeneous silicon thin films : Fundamentals to devices, 1999 : Symposium held April 5-9, 1999, San Francisco, California, U.S.A.
Author 
Branz, Howard M., ed. Materials Research Society Symposium (1999 : San Francisco, Calif.)
Preferred Shelf Number 
TK 7871.99.A45 A444 1999
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4. 
Cover image for Semiconductor materials analysis and fabrication process control proceedings of Symposium D on Diagnostic Techniques for Semiconductor Materials Analysis and Fabrication Process Control of the 1992 E-MRS Spring Conference, Strasbourg, France, June 2-5, 1992
Semiconductor materials analysis and fabrication process control proceedings of Symposium D on Diagnostic Techniques for Semiconductor Materials Analysis and Fabrication Process Control of the 1992 E-MRS Spring Conference, Strasbourg, France, June 2-5, 1992
Author 
Symposium D on Diagnostic Techniques for Semiconductor Materials Analysis and Fabrication Process Control (1992 : Strasbourg, France) Crean, G. M. Stuck, R. Woollam, John A. European Materials Research Society.
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Electronic Access 
ScienceDirect http://www.sciencedirect.com/science/book/9780444899088
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5. 
Cover image for High TC superconductor materials proceedings of Symposium A on High TC Superconductor Materials of the 1990 E-MRS spring conference, Strasbourg, France, 29 May-1 June 1990. Part A
High TC superconductor materials proceedings of Symposium A on High TC Superconductor Materials of the 1990 E-MRS spring conference, Strasbourg, France, 29 May-1 June 1990. Part A
Author 
Symposium A on High Tc Superconductor Materials (1990 : Strasbourg, France) Habermeier, H.-U. Kaldis, Emanuel. Schoenes, J. European Materials Research Society.
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ScienceDirect http://www.sciencedirect.com/science/book/9780444888846
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6. 
Cover image for Superconducting and low-temperature particle detectors proceedings of Symposium C on Superconducting and Low-Temperature Particle Detectors of the 1988 E-MRS Fall Conference, Strasbourg, France, 8-10 November 1988
Superconducting and low-temperature particle detectors proceedings of Symposium C on Superconducting and Low-Temperature Particle Detectors of the 1988 E-MRS Fall Conference, Strasbourg, France, 8-10 November 1988
Author 
Symposium C on Superconducting and Low-Temperature Particle Detectors (1988 : Strasbourg, France) Waysand, G. Chardin, G. European Materials Research Society. Meeting (1988 : Strasbourg, France)
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ScienceDirect http://www.sciencedirect.com/science/book/9780444874146
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7. 
Cover image for CdTe and related compounds physics, defects, hetero- and nanostructures, crystal growth surfaces and applications
CdTe and related compounds physics, defects, hetero- and nanostructures, crystal growth surfaces and applications
Author 
Triboulet, R. Siffert, P. (Paul)
Preferred Shelf Number 
ONLINE
Electronic Access 
ScienceDirect http://www.sciencedirect.com/science/book/9780080965130
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8. 
Cover image for CdTe and related compounds physics, defects, technology, hetero- and nanostructures and applications : physics, CdTe-based nanostructures, and semimagnetic semiconductors, defects
CdTe and related compounds physics, defects, technology, hetero- and nanostructures and applications : physics, CdTe-based nanostructures, and semimagnetic semiconductors, defects
Author 
Triboulet, R. Siffert, P. (Paul)
Preferred Shelf Number 
ONLINE
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ScienceDirect http://www.sciencedirect.com/science/book/9780080464091
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9. 
Cover image for Ion Beam Processing of Materials and Deposition Processes of Protective Coatings Proceedings of Symposium C, Symposium J and Symposium H of the 1995 E-Mrs Spring Conference, Strasbourg, France, May 22-26, 1995
Ion Beam Processing of Materials and Deposition Processes of Protective Coatings Proceedings of Symposium C, Symposium J and Symposium H of the 1995 E-Mrs Spring Conference, Strasbourg, France, May 22-26, 1995
Author 
Symposium J on Correlated Effects in Atomic and Cluster Ion Bombardment and Implantation (1995 : Strasbourg, France) Hemment, P. L. F. (Peter L. F.)
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ScienceDirect http://www.sciencedirect.com/science/book/9780444824103
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10. 
Cover image for C, H, N and O in Si and Characterization and Simulation of Materials and Processes Proceedings of Symposium N and Symposium G of the 1995 E-Mrs Spring Conference, Held in Strasbourg, France, 22-26 May 1995
C, H, N and O in Si and Characterization and Simulation of Materials and Processes Proceedings of Symposium N and Symposium G of the 1995 E-Mrs Spring Conference, Held in Strasbourg, France, 22-26 May 1995
Author 
Symposium N on Carbon, Hydrogen, Nitrogen, and Oxygen in Silicon and Other Elemental Semiconductors (1995 : Strasbourg, France) Borghesi, A. Symposium G on Atomic Scale Characterization and Simulation of Materials and Processes (1995 : Strasbourg, France)
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ScienceDirect http://www.sciencedirect.com/science/book/9780444824134
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11. 
Cover image for Small scale structures proceedings of Symposium A on Microstructuring and Microsystems, Symposium B on Materials for Sensors: Functional Nanoscaled Structures, and Symposium E on Structure and Properties of Metallic Thin Films and Multilayers of the 1995 E-MRS Spring Conference, Strasbourg, France, May 22-26, 1995
Small scale structures proceedings of Symposium A on Microstructuring and Microsystems, Symposium B on Materials for Sensors: Functional Nanoscaled Structures, and Symposium E on Structure and Properties of Metallic Thin Films and Multilayers of the 1995 E-MRS Spring Conference, Strasbourg, France, May 22-26, 1995
Author 
Symposium A on Microstructuring and Microsystems (1995 : Strasbourg, France) Rooij, N. F. de. Symposium B on Materials for Sensors: Functional Nanoscaled Structures (1995 : Strasbourg, France) Symposium E on Structure and Properties of Metallic Thin Films and Multilayers (1995 : Strasbourg, France)
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ScienceDirect http://www.sciencedirect.com/science/book/9780444823120
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12. 
Cover image for Nuclear materials for fission reactors proceedings of Symposium E on Nuclear Materials for Fission Reactors of the 1991 E-MRS Fall Conference, Strasbourg, France, November 4-7, 1991
Nuclear materials for fission reactors proceedings of Symposium E on Nuclear Materials for Fission Reactors of the 1991 E-MRS Fall Conference, Strasbourg, France, November 4-7, 1991
Author 
Symposium E on Nuclear Materials for Fission Reactors (1991 : Strasbourg, France) Matzke, Hj., 1936- Schumacher, G.
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ScienceDirect http://www.sciencedirect.com/science/book/9780444895714
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