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1. 
Cover image for Metrologie des radionuclides par
Metrologie des radionuclides par
Author 
Vuccino, Simone.
Preferred Shelf Number 
QC 795 V79 1968
Format: 
Availability 
Beytepe Library~1
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2. 
Cover image for Metrology in industry the key for quality
Metrology in industry the key for quality
Author 
Collège français de métrologie. Wiley InterScience (Online service)
Preferred Shelf Number 
ONLINE
Electronic Access 
Contributor biographical information http://catdir.loc.gov/catdir/enhancements/fy0806/2006003530-b.html
John Wiley http://dx.doi.org/10.1002/9780470612125
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3. 
Cover image for Transverse disciplines in metrology proceedings of the 13th International Metrology Congress, 2007, Lille, France
Transverse disciplines in metrology proceedings of the 13th International Metrology Congress, 2007, Lille, France
Author 
International Metrology Conference (13th : 2007 : French College of Metrology) Collège français de métrologie. Wiley InterScience (Online service)
Preferred Shelf Number 
ONLINE
Electronic Access 
Ebook Library http://public.eblib.com/EBLPublic/PublicView.do?ptiID=477706
John Wiley http://dx.doi.org/10.1002/9780470611371
http://site.ebrary.com/lib/alltitles/Doc?id=10360928
http://swb.eblib.com/patron/FullRecord.aspx?p=477706
HathiTrust Digital Library, Limited view (search only) http://catalog.hathitrust.org/api/volumes/oclc/230183422.html
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Online Library~1
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4. 
Cover image for Metrology and instrumentation : practical applications for engineering and manufacturing
Metrology and instrumentation : practical applications for engineering and manufacturing
Author 
Mekid, Samir, author.
Preferred Shelf Number 
QC88 .M38 2022
Electronic Access 
https://onlinelibrary.wiley.com/doi/book/10.1002/9781119721789
Format: 
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Online Library~1
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5. 
Cover image for Applications and metrology at nanometer scale. 2, Measurement systems, quantum engineering and RBDO method
Applications and metrology at nanometer scale. 2, Measurement systems, quantum engineering and RBDO method
Author 
Dahoo, Pierre Richard, author. Pougnet, Philippe, author. El Hami, Abdelkhalak, author.
Preferred Shelf Number 
QC88
Electronic Access 
https://onlinelibrary.wiley.com/doi/book/10.1002/9781119818984
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6. 
Cover image for Applications and metrology at nanometer scale. 1, Smart materials, electromagnetic waves and uncertainties
Applications and metrology at nanometer scale. 1, Smart materials, electromagnetic waves and uncertainties
Author 
Dahoo, Pierre Richard. Pougnet, Philippe. El Hami, Abdelkhalak.
Preferred Shelf Number 
QC88
Electronic Access 
https://onlinelibrary.wiley.com/doi/book/10.1002/9781119808244
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7. 
Cover image for Metrology and standardization of nanotechnology : protocols and industrial innovations
Metrology and standardization of nanotechnology : protocols and industrial innovations
Author 
Mansfield, Elisabeth, (Research chemist), editor. Kaiser, Debra L., editor. Fujita, Daisuke (Materials scientist), editor. Voorde, M. H. van de (Marcel H.), editor.
Preferred Shelf Number 
T174.7
Electronic Access 
https://onlinelibrary.wiley.com/doi/book/10.1002/9783527800308
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8. 
Cover image for Fundamental principles of engineering nanometrology
Fundamental principles of engineering nanometrology
Author 
Leach, R. K.
Preferred Shelf Number 
ONLINE(355774.1)
Electronic Access 
ScienceDirect http://www.sciencedirect.com/science/book/9781455777532
http://www.sciencedirect.com/science/book/9780080964546
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9. 
Cover image for Speckle metrology
Speckle metrology
Author 
Erf, Robert K.
Preferred Shelf Number 
ONLINE
Electronic Access 
ScienceDirect http://www.sciencedirect.com/science/book/9780122413605
Format: 
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Online Library~1
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