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Cover image for Applied Technologies 4th International Conference, ICAT 2022, Quito, Ecuador, November 23-25, 2022, Revised Selected Papers, Part I
Applied Technologies 4th International Conference, ICAT 2022, Quito, Ecuador, November 23-25, 2022, Revised Selected Papers, Part I
Author 
Botto-Tobar, Miguel. editor. (orcid) Zambrano Vizuete, Marcelo. editor. Montes León, Sergio. editor. Torres-Carrión, Pablo. editor. Durakovic, Benjamin. editor. (orcid)
Preferred Shelf Number 
XX(520654.1)
Electronic Access 
https://doi.org/10.1007/978-3-031-24985-3
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2. 
Cover image for Measurement data modeling and parameter estimation
Measurement data modeling and parameter estimation
Author 
Wang, Zhengming, 1962-
Preferred Shelf Number 
ONLINE
Electronic Access 
Distributed by publisher. Purchase or institutional license may be required for access.
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3. 
Cover image for Statistical pattern recognition
Statistical pattern recognition
Author 
Webb, A. R. (Andrew R.)
Preferred Shelf Number 
ONLINE(318818.1)
Electronic Access 
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