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1. 
Cover image for Applications and metrology at nanometer scale. 2, Measurement systems, quantum engineering and RBDO method
Applications and metrology at nanometer scale. 2, Measurement systems, quantum engineering and RBDO method
Author 
Dahoo, Pierre Richard, author. Pougnet, Philippe, author. El Hami, Abdelkhalak, author.
Preferred Shelf Number 
QC88
Electronic Access 
https://onlinelibrary.wiley.com/doi/book/10.1002/9781119818984
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2. 
Cover image for Faraday Laser A Frequency-Stabilized Diode Laser Based on Faraday Atomic Optical Filters
Faraday Laser A Frequency-Stabilized Diode Laser Based on Faraday Atomic Optical Filters
Author 
Chen, Jingbiao. author. (orcid)0000-0001-9802-4577 Shi, Tiantian. author. (orcid)0000-0001-9714-0445 Pan, Duo. author. (orcid)0000-0001-7794-8922 Ge, Zheyi. author. (orcid)0009-0002-9490-7684 Zhang, Jia. author. (orcid)0000-0001-8682-8287
Preferred Shelf Number 
ONLINE
Electronic Access 
https://doi.org/10.1007/978-981-97-8023-5
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3. 
Cover image for Metrology and Measurement Uncertainty Concepts and Applications
Metrology and Measurement Uncertainty Concepts and Applications
Author 
Novellino do Rosario, Pedro Paulo. author. Mendes, Alexandre. author. SpringerLink (Online service)
Preferred Shelf Number 
ONLINE
Electronic Access 
https://doi.org/10.1007/978-3-031-82303-9
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4. 
Cover image for Information-Measuring Systems Theory and Application
Information-Measuring Systems Theory and Application
Author 
Babak, Vitalii. author. Babak, Serhii. author. Eremenko, Volodymyr. author. Kuts, Yurii. author. Zaporozhets, Artur. author. (orcid)0000-0002-0704-4116
Preferred Shelf Number 
ONLINE
Electronic Access 
https://doi.org/10.1007/978-3-031-89406-0
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5. 
Cover image for Dynamic Environments Testing, Volume 7 Proceedings of the 41st IMAC, A Conference and Exposition on Structural Dynamics 2023
Dynamic Environments Testing, Volume 7 Proceedings of the 41st IMAC, A Conference and Exposition on Structural Dynamics 2023
Author 
Harvie, Julie. editor. SpringerLink (Online service)
Preferred Shelf Number 
ONLINE
Electronic Access 
https://doi.org/10.1007/978-3-031-34930-0
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6. 
Cover image for Recent Advances in Metrology Select Proceedings of AdMet 2022
Recent Advances in Metrology Select Proceedings of AdMet 2022
Author 
Yadav, Sanjay. editor. (orcid)0000-0002-1450-3202 Garg, Naveen. editor. Aggarwal, Shankar G. editor. (orcid)0000-0002-5809-157X Jaiswal, Shiv Kumar. editor. Kumar, Harish. editor.
Preferred Shelf Number 
ONLINE
Electronic Access 
https://doi.org/10.1007/978-981-99-4594-8
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7. 
Cover image for Recent Advances in Metrology Select Proceedings of AdMet 2021
Recent Advances in Metrology Select Proceedings of AdMet 2021
Author 
Yadav, Sanjay. editor. Chaudhary, K.P. editor. Gahlot, Ajay. editor. Arya, Yogendra. editor. Dahiya, Aman. editor.
Preferred Shelf Number 
ONLINE
Electronic Access 
https://doi.org/10.1007/978-981-19-2468-2
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8. 
Cover image for The new International System of Units (SI) : quantum metrology and quantum standards
The new International System of Units (SI) : quantum metrology and quantum standards
Author 
Göbel, Ernst O., author. Siegner, Uwe, author.
Preferred Shelf Number 
QC91 .G63 2019
Electronic Access 
https://onlinelibrary.wiley.com/doi/book/10.1002/9783527814480
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