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Cover image for Testing static random access memories : Defects, fault models, and test patterns
Testing static random access memories : Defects, fault models, and test patterns
Author 
Hamdioui, Said.
Preferred Shelf Number 
TK7895.M4 H34 2004
Format: 
Availability 
Beytepe Library~1
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2. 
Cover image for Thin film magnetoresistive sensors
Thin film magnetoresistive sensors
Author 
Tumanski, Slawomir., author.
Preferred Shelf Number 
TK7872 .T55 T853 2001
Electronic Access 
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Availability 
Online Library~1
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