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Defect-Oriented Testing for Nano-Metric CMOS VLSI Circuits 2nd Edition

Author

Sachdev, Manoj. editor. Gyvez, José Pineda de. editor. SpringerLink (Online service)

Preferred Shelf Number

ONLINE

Electronic Access

http://dx.doi.org/10.1007/0-387-46547-2

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Online Library~1

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Thermal and power management of integrated circuits

Author

Vassighi, Arman, 1966- Sachdev, Manoj.

Preferred Shelf Number

TK7874 .V37 2006

Format:

Availability

Beytepe Library~1

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CMOS SRAM Circuit Design and Parametric Test in Nano-Scaled Technologies Process-Aware SRAM Design and Test

Author

Pavlov, Andrei. author. Sachdev, Manoj. author. SpringerLink (Online service)

Preferred Shelf Number

ONLINE

Electronic Access

http://dx.doi.org/10.1007/978-1-4020-8363-1

Format:

Availability

Online Library~1

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Thermal and Power Management of Integrated Circuits

Author

Vassighi, Arman. author. Sachdev, Manoj. author. SpringerLink (Online service)

Preferred Shelf Number

ONLINE

Electronic Access

http://dx.doi.org/10.1007/0-387-29749-9

Format:

Availability

Online Library~1

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ESD Protection Device and Circuit Design for Advanced CMOS Technologies

Author

Semenov, Oleg. author. Sarbishaei, Hossein. author. Sachdev, Manoj. author. SpringerLink (Online service)

Preferred Shelf Number

ONLINE

Electronic Access

http://dx.doi.org/10.1007/978-1-4020-8301-3

Format:

Availability

Online Library~1

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