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1. 
Cover image for Wide bandgap semiconductor spintronics
Wide bandgap semiconductor spintronics
Author 
Litvinov, Vladimir, author.
Preferred Shelf Number 
TK7874.887
Electronic Access 
Taylor & Francis https://www.taylorfrancis.com/books/9781003480228
OCLC metadata license agreement http://www.oclc.org/content/dam/oclc/forms/terms/vbrl-201703.pdf
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2. 
Cover image for Optical principles and technology for engineers
Optical principles and technology for engineers
Author 
Stewart, James E, author. Taylor and Francis.
Preferred Shelf Number 
TS165 .S749 2014
Electronic Access 
Click here to view.
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3. 
Cover image for Engineering quantum mechanics
Engineering quantum mechanics
Author 
Ahn, Doyeol. Park, Seoung-Hwan.
Preferred Shelf Number 
ONLINE
Electronic Access 
IEEE Xplore http://ieeexplore.ieee.org/xpl/bkabstractplus.jsp?bkn=6078482
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4. 
Cover image for RF and microwave modeling and measurement techniques for field effect transistors
RF and microwave modeling and measurement techniques for field effect transistors
Author 
Gao, Jianjun, 1968- Knovel (Firm)
Preferred Shelf Number 
ONLINE
Electronic Access 
EBSCOhost http://search.ebscohost.com/login.aspx?direct=true&scope=site&db=nlebk&db=nlabk&AN=571541
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5. 
Cover image for Charge-based MOS transistor modeling the EKV model for low-power and RF IC design
Charge-based MOS transistor modeling the EKV model for low-power and RF IC design
Author 
Enz, Christian. Vittoz, Eric A., 1938- Wiley InterScience (Online service)
Preferred Shelf Number 
ONLINE
Electronic Access 
John Wiley http://dx.doi.org/10.1002/0470855460
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6. 
Cover image for C, H, N and O in Si and Characterization and Simulation of Materials and Processes Proceedings of Symposium N and Symposium G of the 1995 E-Mrs Spring Conference, Held in Strasbourg, France, 22-26 May 1995
C, H, N and O in Si and Characterization and Simulation of Materials and Processes Proceedings of Symposium N and Symposium G of the 1995 E-Mrs Spring Conference, Held in Strasbourg, France, 22-26 May 1995
Author 
Symposium N on Carbon, Hydrogen, Nitrogen, and Oxygen in Silicon and Other Elemental Semiconductors (1995 : Strasbourg, France) Borghesi, A. Symposium G on Atomic Scale Characterization and Simulation of Materials and Processes (1995 : Strasbourg, France)
Preferred Shelf Number 
ONLINE
Electronic Access 
ScienceDirect http://www.sciencedirect.com/science/book/9780444824134
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7. 
Cover image for Computer simulation using particles
Computer simulation using particles
Author 
Hockney, Roger W., author.
Preferred Shelf Number 
QA76.9 .C65
Electronic Access 
Taylor & Francis https://www.taylorfrancis.com/books/9780367806934
OCLC metadata license agreement http://www.oclc.org/content/dam/oclc/forms/terms/vbrl-201703.pdf
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