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1. 
Cover image for Cutting Edge Applications of Computational Intelligence Tools and Techniques
Cutting Edge Applications of Computational Intelligence Tools and Techniques
Author 
Daimi, Kevin. editor. Alsadoon, Abeer. editor. Coelho, Luis. editor. SpringerLink (Online service)
Preferred Shelf Number 
ONLINE
Electronic Access 
https://doi.org/10.1007/978-3-031-44127-1
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2. 
Cover image for Proceedings of the International Conference on Transformations in Engineering Education ICTIEE 2014
Proceedings of the International Conference on Transformations in Engineering Education ICTIEE 2014
Author 
Natarajan, R. editor. SpringerLink (Online service)
Preferred Shelf Number 
ONLINE
Electronic Access 
https://doi.org/10.1007/978-81-322-1931-6
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3. 
Cover image for Digital filters principles and applications with MATLAB
Digital filters principles and applications with MATLAB
Author 
Taylor, Fred J., 1940-
Preferred Shelf Number 
ONLINE
Electronic Access 
IEEE Xplore http://ieeexplore.ieee.org/servlet/opac?bknumber=6047599
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4. 
Cover image for Frequency stability introduction and applications
Frequency stability introduction and applications
Author 
Kroupa, Věnceslav F., 1923-
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ONLINE
Electronic Access 
IEEE Xplore http://ieeexplore.ieee.org/xpl/bkabstractplus.jsp?bkn=6331042
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5. 
Cover image for Future trends in microelectronics from nanophotonics to sensors and energy
Future trends in microelectronics from nanophotonics to sensors and energy
Author 
Luryi, Serge. Xu, Jimmy. Zaslavsky, Alexander.
Preferred Shelf Number 
ONLINE
Electronic Access 
IEEE Xplore http://ieeexplore.ieee.org/xpl/bkabstractplus.jsp?bkn=5599322
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6. 
Cover image for Advanced signal integrity for high-speed digital designs
Advanced signal integrity for high-speed digital designs
Author 
Hall, Stephen H. Heck, Howard L.
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ONLINE
Electronic Access 
IEEE Xplore http://ieeexplore.ieee.org/xpl/bkabstractplus.jsp?bkn=5361024
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7. 
Cover image for Electrostatic discharge understand, simulate and fix ESD problems
Electrostatic discharge understand, simulate and fix ESD problems
Author 
Mardiguian, Michel.
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ONLINE
Electronic Access 
IEEE Xplore http://ieeexplore.ieee.org/xpl/bkabstractplus.jsp?bkn=5361037
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8. 
Cover image for Reliability wearout mechanisms in advanced CMOS technologies
Reliability wearout mechanisms in advanced CMOS technologies
Author 
Strong, Alvin Wayne, 1946-
Preferred Shelf Number 
ONLINE
Electronic Access 
IEEE Xplore http://ieeexplore.ieee.org/xpl/bkabstractplus.jsp?bkn=5361029
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9. 
Cover image for Future trends in microelectronics up the nano creek
Future trends in microelectronics up the nano creek
Author 
FTM-5 (2006 : Crete, Greece) Luryi, Serge. Xu, Jimmy. Zaslavsky, Alex, 1963-
Preferred Shelf Number 
ONLINE
Electronic Access 
IEEE Xplore http://ieeexplore.ieee.org/xpl/bkabstractplus.jsp?bkn=5201522
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10. 
Cover image for Managing power electronics VLSI and DSP-driven computer systems
Managing power electronics VLSI and DSP-driven computer systems
Author 
Rossetti, Nazzareno, 1951-
Preferred Shelf Number 
ONLINE
Electronic Access 
IEEE Xplore http://ieeexplore.ieee.org/xpl/bkabstractplus.jsp?bkn=5236490
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