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1. 
Cover image for Nonlinear Transistor Model Parameter Extraction Techniques
Nonlinear Transistor Model Parameter Extraction Techniques
Author 
Rudolph, Matthias. Fager, Christian. Root, David E..
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2. 
Cover image for RF and microwave modeling and measurement techniques for field effect transistors
RF and microwave modeling and measurement techniques for field effect transistors
Author 
Gao, Jianjun, 1968- Knovel (Firm)
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EBSCOhost http://search.ebscohost.com/login.aspx?direct=true&scope=site&db=nlebk&db=nlabk&AN=571541
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3. 
Cover image for Measurement and modeling of silicon heterostructure devices
Measurement and modeling of silicon heterostructure devices
Author 
Cressler, John D.
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4. 
Cover image for Modeling and Characterization of RF and Microwave Power FETs
Modeling and Characterization of RF and Microwave Power FETs
Author 
Aaen, Peter. Plá, Jaime A.. Wood, John.
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5. 
Cover image for Charge-based MOS transistor modeling the EKV model for low-power and RF IC design
Charge-based MOS transistor modeling the EKV model for low-power and RF IC design
Author 
Enz, Christian. Vittoz, Eric A., 1938- Wiley InterScience (Online service)
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John Wiley http://dx.doi.org/10.1002/0470855460
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