Semiconductor process reliability in practice

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Title:

Author:

Gan, Zhenghao.

ISBN:

9780071754286

Publication Information:

New York : McGraw Hill Professional, [2012]

Physical Description:

1 electronic text (xv, 605 p. : ill.) : PDF file.

Series:

McGraw Hill ebook library. Engineering and computing, Electrical and electronics

Series Title:

McGraw Hill ebook library. Engineering and computing, Electrical and electronics

Subject Term:

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Library	Material Type	Item Barcode	Shelf Number	Status	Item Holds
Searching... Online Library	E-Book	293479-1001	ONLINE	Searching... Unknown	Searching... Unavailable