Cover image for System-on-chip test architectures nanometer design for testability
Title:
System-on-chip test architectures nanometer design for testability
Author:
Wang, Laung-Terng.
ISBN:
9780123739735

9780080556802
Publication Information:
Amsterdam ; Boston : Morgan Kaufmann Publishers, c2008.
Physical Description:
1 online resource (xxxvi, 856 p.) : ill.
Series:
The Morgan Kaufmann series in systems on silicon
Series Title:
The Morgan Kaufmann series in systems on silicon
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E-Book 148557-2001 ONLINE
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