Title:
Test Generation of Crosstalk Delay Faults in VLSI Circuits
Author:
Jayanthy, S. author.
ISBN:
9789811324932
Edition:
1st ed. 2019.
Physical Description:
XI, 156 p. 49 illus., 7 illus. in color. online resource.
Added Author:
Added Corporate Author:
Electronic Access:
https://doi.org/10.1007/978-981-13-2493-2Copies:
Available:*
Library | Material Type | Item Barcode | Shelf Number | Status | Item Holds |
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Searching... | E-Book | 484415-1001 | ONLINE | Searching... | Searching... |