Cover image for Reliability of High Mobility SiGe Channel MOSFETs for Future CMOS Applications
Title:
Reliability of High Mobility SiGe Channel MOSFETs for Future CMOS Applications
Author:
Franco, Jacopo. author.
ISBN:
9789400776630
Edition:
1st ed. 2014.
Physical Description:
XIX, 187 p. 219 illus. online resource.
Series:
Springer Series in Advanced Microelectronics, 47
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