Cover image for Reliability wearout mechanisms in advanced CMOS technologies
Title:
Reliability wearout mechanisms in advanced CMOS technologies
Author:
Strong, Alvin Wayne, 1946-
ISBN:
9780470455265

9780470455258
Publication Information:
Piscataway, NJ : IEEE Press ; Hoboken, NJ : Wiley, c2009.
Physical Description:
1 online resource (xv, 624 p.) : ill.
Series:
IEEE Press series on microelectronic systems

IEEE Press series on microelectronic systems.
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