Title:
VLSI Design and Test 22nd International Symposium, VDAT 2018, Madurai, India, June 28-30, 2018, Revised Selected Papers
Author:
Rajaram, S. editor.
ISBN:
9789811359507
Edition:
1st ed. 2019.
Physical Description:
XVIII, 722 p. 711 illus., 324 illus. in color. online resource.
Series:
Communications in Computer and Information Science, 892
Added Corporate Author:
Electronic Access:
https://doi.org/10.1007/978-981-13-5950-7Copies:
Available:*
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