Title:
Emerging Nanotechnologies Test, Defect Tolerance, and Reliability
Author:
Tehranipoor, Mohammad. editor.
ISBN:
9780387747477
Physical Description:
online resource.
Series:
Frontiers in Electronic Testing, 37
Series Title:
Frontiers in Electronic Testing, 0929-1296 ; 37
Added Corporate Author:
Electronic Access:
http://dx.doi.org/10.1007/978-0-387-74747-7Copies:
Available:*
Library | Material Type | Item Barcode | Shelf Number | Status | Item Holds |
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Searching... | E-Book | 167204-2001 | ONLINE | Searching... | Searching... |