Title:
Lifetime Spectroscopy A Method of Defect Characterization in Silicon for Photovoltaic Applications
Author:
Rein, Stefan. author.
ISBN:
9783540279228
Physical Description:
XXVI, 489 p. 153 illus. online resource.
Series:
Springer Series in Material Science, 85
Series Title:
Springer Series in Material Science, 0933-033X ; 85
Added Corporate Author:
Electronic Access:
http://dx.doi.org/10.1007/3-540-27922-9Copies:
Available:*
Library | Material Type | Item Barcode | Shelf Number | Status | Item Holds |
|---|---|---|---|---|---|
Searching... | E-Book | 181606-2001 | ONLINE | Searching... | Searching... |