Title:
Infrared Ellipsometry on Semiconductor Layer Structures Phonons, Plasmons, and Polaritons
Author:
Schubert, Mathias. author.
ISBN:
9783540447016
Physical Description:
XI, 193 p. 77 illus. online resource.
Series:
Springer Tracts in Modern Physics, 209
Series Title:
Springer Tracts in Modern Physics, 0081-3869 ; 209
Added Corporate Author:
Electronic Access:
http://dx.doi.org/10.1007/b11964Copies:
Available:*
Library | Material Type | Item Barcode | Shelf Number | Status | Item Holds |
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Searching... | E-Book | 184793-2001 | ONLINE | Searching... | Searching... |