Skip to:Content
|
Bottom
Cover image for VLSI test principles and architectures design for testability
Title:
VLSI test principles and architectures design for testability
Author:
Wang, Laung-Terng.
ISBN:
9780080474793
Publication Information:
Amsterdam ; Boston : Elsevier Morgan Kaufmann Publishers, c2006.
Physical Description:
1 online resource (xxx, 777 p.) : ill.
Series:
The Morgan Kaufmann series in systems on silicon
Series Title:
The Morgan Kaufmann series in systems on silicon
Subject Term:
Integrated circuits -- Very large scale integration -- Testing.

Integrated circuits -- Very large scale integration -- Design.

Testen.

VLSI.
Added Author:
Wang, Laung-Terng.

Wu, Cheng-Wen, EE Ph. D.

Wen, Xiaoqing.
Electronic Access:
ScienceDirect http://www.sciencedirect.com/science/book/9780123705976
Holds:
Copies:

Available:*

Library
Material Type
Item Barcode
Shelf Number
Status
Item Holds
Searching...
 E-Book 253779-1001 ONLINE
Searching...

On Order

Go to:Top of Page