Cover image for Computed electron micrographs and defect identification
Title:
Computed electron micrographs and defect identification
Author:
Head, A. K.
ISBN:
9780720417579

9780444601476
Publication Information:
Amsterdam, North-Holland Pub. Co., 1973.
Physical Description:
1 online resource (x, 400 p. with illus.)
Series:
Defects in crystalline solids, v. 7
Series Title:
Defects in crystalline solids, v. 7
Added Author:
Holds:
Copies:

Available:*

Library
Material Type
Item Barcode
Shelf Number
Status
Item Holds
Searching...
E-Book 256160-1001 ONLINE
Searching...

On Order