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Cover image for Helium Ion Microscopy Principles and Applications
Title:
Helium Ion Microscopy Principles and Applications
Author:
Joy, David C. author.
ISBN:
9781461486602
Physical Description:
VIII, 64 p. 29 illus., 16 illus. in color. online resource.
Series:
SpringerBriefs in Materials,
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E-Book 332438-1001 ONLINE(332438.1)
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