
Title:
Design and analysis of accelerated tests for mission critical reliability
Author:
LuValle, Michael J., author.
ISBN:
9780203492031
9781135436193
9781135436148
9781135436186
Physical Description:
1 online resource (236 pages)
Contents:
chapter 1 Background -- chapter 2 Demarcation Mapping: Initial Design of Accelerated Tests -- chapter 3 Interface for Building Kinetic Models -- chapter 4 Evanescent Process Mapping -- chapter 5 Data Analysis for Failure Time Data -- chapter 6 Data Analysis for Degradation Data.
Electronic Access:
Click here to view.Copies:
Available:*
Library | Material Type | Item Barcode | Shelf Number | Status | Item Holds |
|---|---|---|---|---|---|
Searching... | E-Book | 546254-1001 | TA169.3 .L88 2004 | Searching... | Searching... |
